Probe Reflection and Transmission Based Atomic Microscopy

Abstract

The precise position measurement of atoms using reflection and transmission beams of light is studied in this manuscript. It is reported that the transmission and reflection of probe light can be used to detect the localized position of atoms in one dimension which exhibit high resolution and varying number of peaks. Notably, sharp peaks of localization are reported in the transmission and reflection spectra, within the half-wavelength domain. Remarkably, the localized peaks undergo a shift from one half-wavelength domain to another when the sign of the phase in the standing wave field is altered. The theoretical results obtained for atom microscopy in the reflection and transmission spectra hold promising applications in advanced laser cooling technology.