Development and commercialization of laser inspection system to detect surface flaws of machined holes

Q4 Social Sciences
S. Okada, O. Nakamura, Yasufumi Esaki
{"title":"Development and commercialization of laser inspection system to detect surface flaws of machined holes","authors":"S. Okada, O. Nakamura, Yasufumi Esaki","doi":"10.5571/SYNTH.11.3_137","DOIUrl":null,"url":null,"abstract":"Systems with various methods have been developed such as eddy current, camera imaging, and laser reflection, but none attained the level that could satisfy on-site demands. Okada et al . have engaged in R&D of advanced industrial measurement systems using semiconductor lasers that are small, lightweight, and easy to handle, and developed new devices that could measure glossy or mirror surfaces that were difficult to measure with conventional measurement technology. Utilizing this experience, and collaborating closely with regional companies, AIST and Sigma engaged in the development of a system to conduct high-speed and high-precision inspection for minute flaws and defects on the inner wall surfaces of machined holes with various diameters, and finally succeeded in developing and commercializing a laser defect inspection system. An indispensable aspect of manufacturing is the external inspection of all product parts. For example, in the manufacturing of cars, autonomous inspection technology is required to detect minute flaws on glossy or mirror surfaces, which are easily overlooked by visual inspection. In this paper, we report on the history, significance, and future development of an innovative defect inspection system, “ANALYZER,” which has been developed and commercialized. This system utilizes AIST technology—optical diffraction by semiconductor laser—to realize accurate, autonomous inspection of inner wall surfaces of high quality machined holes of various sizes. from Synthesiology , Vol.11, No.3, p.137–147 (2018)]","PeriodicalId":39206,"journal":{"name":"Synthesiology","volume":"1 1","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2019-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Synthesiology","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.5571/SYNTH.11.3_137","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"Social Sciences","Score":null,"Total":0}
引用次数: 0

Abstract

Systems with various methods have been developed such as eddy current, camera imaging, and laser reflection, but none attained the level that could satisfy on-site demands. Okada et al . have engaged in R&D of advanced industrial measurement systems using semiconductor lasers that are small, lightweight, and easy to handle, and developed new devices that could measure glossy or mirror surfaces that were difficult to measure with conventional measurement technology. Utilizing this experience, and collaborating closely with regional companies, AIST and Sigma engaged in the development of a system to conduct high-speed and high-precision inspection for minute flaws and defects on the inner wall surfaces of machined holes with various diameters, and finally succeeded in developing and commercializing a laser defect inspection system. An indispensable aspect of manufacturing is the external inspection of all product parts. For example, in the manufacturing of cars, autonomous inspection technology is required to detect minute flaws on glossy or mirror surfaces, which are easily overlooked by visual inspection. In this paper, we report on the history, significance, and future development of an innovative defect inspection system, “ANALYZER,” which has been developed and commercialized. This system utilizes AIST technology—optical diffraction by semiconductor laser—to realize accurate, autonomous inspection of inner wall surfaces of high quality machined holes of various sizes. from Synthesiology , Vol.11, No.3, p.137–147 (2018)]
用于检测加工孔表面缺陷的激光检测系统的开发和商业化
已经开发了各种方法的系统,如涡流,相机成像和激光反射,但没有一个达到可以满足现场需求的水平。Okada等人。致力于研发使用半导体激光器的先进工业测量系统,该系统体积小,重量轻,易于操作,并开发了可以测量传统测量技术难以测量的光滑或镜面的新设备。利用这一经验,并与地区公司紧密合作,AIST和Sigma开发了一套系统,用于对各种直径的加工孔内壁表面的微小缺陷和缺陷进行高速高精度检测,最终成功开发并商业化了激光缺陷检测系统。制造过程中不可缺少的一个方面是对所有产品部件的外部检验。例如,在汽车制造中,需要自动检测技术来检测光滑或镜面上的微小缺陷,这些缺陷很容易被肉眼检测忽略。在本文中,我们报告了一个创新的缺陷检测系统“ANALYZER”的历史,意义和未来的发展,该系统已经开发并商业化。该系统利用半导体激光衍射技术,实现了对各种尺寸的高质量加工孔内壁表面的精确、自主检测。摘自《合成学》,Vol.11, No.3, p.137-147 (2018)]
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
Synthesiology
Synthesiology Social Sciences-Social Sciences (all)
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信