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A critique of the approach to controlling electrostatic risk in semiconductor production and identification of a potential risk from the use of equipotential bonding

Q3 Engineering
AIMS Electronics and Electrical Engineering Pub Date : 2019-01-01 DOI:10.3934/electreng.2019.4.397
Gavin C Rider
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来源期刊
AIMS Electronics and Electrical Engineering
AIMS Electronics and Electrical Engineering Engineering-Control and Systems Engineering
CiteScore
2.40
自引率
0.00%
发文量
19
审稿时长
8 weeks
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