Resonance shifting by ferrite thick film superstrate

Abstract

Fritless thick films of Ni-Co-Zn ferrites were fabricated by screen printing technique on alumina substrates. Structural analysis was undertaken using X-ray diffraction and Scanning electron microscopy techniques. A new approach for the determination of complex permittivity (   and   ) using microwave property perturbation is unveiled. Ag thick film microstrip ring resonator (MSRR) with and without the thick film substrate was used for the microwave transmission studies in the frequency region of 812 GHz. The microwave conductivity of the thick films lies in the range of 1.779 S/cm to 2.296 S/cm. The penetration depth is also reported within the X-band of microwave frequencies.