Dongyang Jiang;Sai-Weng Sin;Liang Qi;Guoxing Wang;Rui P. Martins
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引用次数: 4
Abstract
High precision data acquisition requires very-high-resolution Analog-to-digital converters (ADC) for kHz speed or to keep a relatively high resolution for wider bandwidth (BW) around the MHz range. Although widely used, noise-shaping (NS) in ADCs offers a high-resolution characteristic, but obtaining good power efficiency and compact die area is still challenging. Recent literature showed promising progress by utilizing hybrid Discrete-Time (DT) NS-ADCs with measured silicon results. This paper focuses its analysis and discussion on two important trending classes: hybrid Incremental ADCs (I-ADC) and hybrid Time-interleaved (TI) NS-ADCs. Furthermore, this paper presents a review and addresses the benefits of those hybrid architectures.