{"title":"Investigation of dislocations in 4H-SiC by g•b contrast analysis using TEM","authors":"Takahito Mori, Tomonori Hiki, M. Yoshikawa","doi":"10.1384/jsa.29.205","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":90628,"journal":{"name":"Journal of surface analysis (Online)","volume":"1 1","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2023-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of surface analysis (Online)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1384/jsa.29.205","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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