L. Ho, P. Bloom, J. Vega, S. Yemul, Wei Zhao, L. Ward, Evan Savage, R. Rooney, D. Patel, G. Pasinetti
{"title":"Biomarkers of Resilience in Stress Reduction for Caregivers of Alzheimer’s Patients","authors":"L. Ho, P. Bloom, J. Vega, S. Yemul, Wei Zhao, L. Ward, Evan Savage, R. Rooney, D. Patel, G. Pasinetti","doi":"10.1007/s12017-016-8388-8","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":3,"journal":{"name":"ACS Applied Electronic Materials","volume":null,"pages":null},"PeriodicalIF":4.3000,"publicationDate":"2016-03-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1007/s12017-016-8388-8","citationCount":"20","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"ACS Applied Electronic Materials","FirstCategoryId":"3","ListUrlMain":"https://doi.org/10.1007/s12017-016-8388-8","RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}