{"title":"A Scale-Critical Trapped Surface Formation Criterion: A New Proof Via Signature for Decay Rates","authors":"Xinliang An","doi":"10.1007/s40818-021-00114-1","DOIUrl":null,"url":null,"abstract":"<div><p>We provide a self-contained proof of a trapped surface formation theorem, which simplifies the previous results by Christodoulou and by An–Luk. Our argument is based on a systematic approach for the scale-critical estimates in An–Luk and it connects Christodoulou’s short-pulse method and Klainerman–Rodnianski’s signature counting argument to the peeling properties previously studied in the small-data regime such as Klainerman–Nicolo. In particular this allows us to avoid elliptic estimates and geometric renormalizations, and gives us new technical improvements and simplifications.</p></div>","PeriodicalId":36382,"journal":{"name":"Annals of Pde","volume":"8 1","pages":""},"PeriodicalIF":2.4000,"publicationDate":"2022-01-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://link.springer.com/content/pdf/10.1007/s40818-021-00114-1.pdf","citationCount":"6","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Annals of Pde","FirstCategoryId":"100","ListUrlMain":"https://link.springer.com/article/10.1007/s40818-021-00114-1","RegionNum":1,"RegionCategory":"数学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"MATHEMATICS","Score":null,"Total":0}
引用次数: 6
Abstract
We provide a self-contained proof of a trapped surface formation theorem, which simplifies the previous results by Christodoulou and by An–Luk. Our argument is based on a systematic approach for the scale-critical estimates in An–Luk and it connects Christodoulou’s short-pulse method and Klainerman–Rodnianski’s signature counting argument to the peeling properties previously studied in the small-data regime such as Klainerman–Nicolo. In particular this allows us to avoid elliptic estimates and geometric renormalizations, and gives us new technical improvements and simplifications.