Retracted: Research on tridimensional monitoring and defence technology of substation

IF 1 4区工程技术 Q4 ENGINEERING, ELECTRICAL & ELECTRONIC

Iet Circuits Devices & Systems Pub Date : 2022-09-14 DOI:10.1049/cds2.12129

Kaiyi Qiu, Xin Liu, Jie Liu, Hongbo Ma, Jingya Li, Zhengchao Zhang, Guangliang Chen, Li Cai

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引用次数: 0

Abstract

Retraction: [Kaiyi Qiu, Xin Liu, Jie Liu, Hongbo Ma, Jingya Li, Zhengchao Zhang, Guangliang Chen, Li Cai, Research on tridimensional monitoring and defence technology of substation, IET Circuits, Devices & Systems 2022 (https://doi.org/10.1049/cds2.12129)].

The above article from IET Circuits, Devices & Systems, published online on 14 September 2022 in Wiley Online Library (wileyonlinelibrary.com), has been retracted by agreement between the Editor-in-Chief, Harry E. Ruda, the Institution of Engineering and Technology (the IET) and John Wiley and Sons Ltd. This article was published as part of a Guest Edited special issue. Following an investigation, the IET and the journal have determined that the article was not reviewed in line with the journal’s peer review standards and there is evidence that the peer review process of the special issue underwent systematic manipulation. Accordingly, we cannot vouch for the integrity or reliability of the content. As such we have taken the decision to retract the article. The authors have been informed of the decision to retract.

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收回：变电站立体监控与防御技术研究

收回：[邱开义，刘鑫，刘杰，马洪波，李静雅，张正超，陈光亮，李才，变电站三维监控与防御技术研究，IET电路，器件与系统2022(https://doi.org/10.1049/cds2.12129)]。来自IET Circuits，Devices&；《系统》于2022年9月14日在威利在线图书馆（wileyonlinelibrary.com）在线出版，经主编Harry E.Ruda、工程与技术学会（IET）和John Wiley and Sons有限公司同意撤回。本文作为客座编辑特刊的一部分出版。经过调查，IET和该杂志确定，这篇文章没有按照该杂志的同行评审标准进行评审，有证据表明该特刊的同行评审过程受到了系统的操纵。因此，我们不能保证内容的完整性或可靠性。因此，我们决定收回这篇文章。提交人已被告知撤回的决定。

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来源期刊

Iet Circuits Devices & Systems 工程技术-工程：电子与电气

CiteScore

3.80

自引率

7.70%

发文量

审稿时长

3 months

期刊介绍： IET Circuits, Devices & Systems covers the following topics: Circuit theory and design, circuit analysis and simulation, computer aided design Filters (analogue and switched capacitor) Circuit implementations, cells and architectures for integration including VLSI Testability, fault tolerant design, minimisation of circuits and CAD for VLSI Novel or improved electronic devices for both traditional and emerging technologies including nanoelectronics and MEMs Device and process characterisation, device parameter extraction schemes Mathematics of circuits and systems theory Test and measurement techniques involving electronic circuits, circuits for industrial applications, sensors and transducers