A chipless light switch for smart-homes

IF 1 4区工程技术 Q4 ENGINEERING, ELECTRICAL & ELECTRONIC

Iet Circuits Devices & Systems Pub Date : 2023-07-06 DOI:10.1049/cds2.12163

Abdullah S. Almansouri

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引用次数: 1

Abstract

The limited and inconvenient functionality of conventional light switches is out of pace with current advancements in wireless sensors. A chipless RFID light switch (CLS) that is passive, battery-free and relocatable and maintains the convenience of having physical buttons for controlling lightbulbs or other electrical devices is introduced. These characteristics have been achieved by attaching single-pole-single-through toggle switches to the edges of radio frequency spiral resonators. The status of the switches activates or deactivates the resonators, allowing the CLS tag to passively communicate the status of the switches. A CLS tag with two ID resonators (used for tag identifications), and two measurement resonators [MRs] (connected with switches and used to communicate the status of the switches) was designed and fabricated using a 1-mm-thick FR4 substrate. Measurement results showed resonant frequencies at 1115 and 1220 MHz corresponding to the ID resonators and frequencies at 848 and 971 MHz corresponding to the MRs. Turning the switches OFF and ON successfully activated and deactivated the MRs.

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用于智能家居的无芯片电灯开关

传统电灯开关的有限且不方便的功能与当前无线传感器的发展步伐脱节。介绍了一种无源、无电池、可重新定位的无芯片RFID光开关（CLS），该开关保持了具有用于控制灯泡或其他电气设备的物理按钮的便利性。这些特性是通过将单极单通拨动开关连接到射频螺旋谐振器的边缘来实现的。开关的状态激活或停用谐振器，允许CLS标签被动地传达开关的状态。使用1mm厚的FR4基板设计和制造了具有两个ID谐振器（用于标签识别）和两个测量谐振器[MRs]（与开关连接并用于传达开关状态）的CLS标签。测量结果显示，1115和1220MHz的谐振频率对应于ID谐振器，848和971MHz的频率对应于MR。关闭和打开开关成功地激活和停用了MR。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

Iet Circuits Devices & Systems 工程技术-工程：电子与电气

CiteScore

3.80

自引率

7.70%

发文量

审稿时长

3 months

期刊介绍： IET Circuits, Devices & Systems covers the following topics: Circuit theory and design, circuit analysis and simulation, computer aided design Filters (analogue and switched capacitor) Circuit implementations, cells and architectures for integration including VLSI Testability, fault tolerant design, minimisation of circuits and CAD for VLSI Novel or improved electronic devices for both traditional and emerging technologies including nanoelectronics and MEMs Device and process characterisation, device parameter extraction schemes Mathematics of circuits and systems theory Test and measurement techniques involving electronic circuits, circuits for industrial applications, sensors and transducers