Retracted

IF 1 4区工程技术 Q4 ENGINEERING, ELECTRICAL & ELECTRONIC

Iet Circuits Devices & Systems Pub Date : 2023-07-04 DOI:10.1049/cds2.12164

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引用次数: 4

Abstract

Retraction: [Xiaojian Wang, Xiaoye Sun, Zixuan Wang, Construction of visual evaluation system for building block night scene lighting based on multi-target recognition and data processing, IET Circuits, Devices & Systems 2023 (https://doi.org/10.1049/cds2.12154)].

The above article [1] from IET Circuits, Devices & Systems, published online on 22 February 2023 in the Wiley Online Library (https://ietresearch.onlinelibrary.wiley.com/doi/10.1049/cds2.12154) has been retracted by agreement between the editor-in-chief, Harry E. Ruda, the Institution of Engineering and Technology (the IET) and John Wiley and Sons Ltd. This article was published as part of a guest-edited special issue. Following an investigation, the IET and the journal have determined that the article was not reviewed in line with the journal's peer review standards, and there is evidence that the peer review process of the special issue underwent systematic manipulation. Accordingly, we cannot vouch for the integrity or reliability of the content. Therefore, we have taken the decision to retract the article. The authors have been informed of the decision to retract.

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缩回

收回：[王晓建，孙晓烨，王子璇，基于多目标识别和数据处理的积木夜景照明视觉评价系统的构建，IET电路、器件与系统2023(https://doi.org/10.1049/cds2.12154)]来自IET Circuits，Devices&；系统，于2023年2月22日在威利在线图书馆在线出版(https://ietresearch.onlinelibrary.wiley.com/doi/10.1049/cds2.12154)经编辑Harry E.Ruda、工程与技术学会（IET）和John Wiley and Sons有限公司同意撤回。本文作为客座编辑特刊的一部分发表。经过调查，IET和该杂志确定该文章没有按照该杂志的同行评审标准进行评审，有证据表明该特刊的同行评审过程受到了系统的操纵。因此，我们不能保证内容的完整性或可靠性。因此，我们决定撤回这篇文章。提交人已被告知撤回的决定。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

Iet Circuits Devices & Systems 工程技术-工程：电子与电气

CiteScore

3.80

自引率

7.70%

发文量

审稿时长

3 months

期刊介绍： IET Circuits, Devices & Systems covers the following topics: Circuit theory and design, circuit analysis and simulation, computer aided design Filters (analogue and switched capacitor) Circuit implementations, cells and architectures for integration including VLSI Testability, fault tolerant design, minimisation of circuits and CAD for VLSI Novel or improved electronic devices for both traditional and emerging technologies including nanoelectronics and MEMs Device and process characterisation, device parameter extraction schemes Mathematics of circuits and systems theory Test and measurement techniques involving electronic circuits, circuits for industrial applications, sensors and transducers