{"title":"Self-correction of fringe order jump error induced by system nonlinearity based on phase-coding method","authors":"Ze-Bo Wu, Wei Tao, Na Lv, Hui Zhao","doi":"10.1007/s10043-023-00825-9","DOIUrl":null,"url":null,"abstract":"<div><p>Temporal phase unwrapping based on phase-encoding is a technique widely used in 3D measurement for its high-speed advantage. However, eliminating fringe order jump error induced by the system’s luminance nonlinearity is still a key challenge. We propose a fringe order jump error self-correction method to address this issue. First, we encode the shifting phase and stair phase separately and combine them into the same pattern based on four-step phase shifting. This allows us to calculate the fringe order and wrapped phase simultaneously and avoid the overlapping of two set phases. Then, we add auxiliary patterns to obtain information on the order-located period’s odd-evenness characteristic. Theoretically, we demonstrate that under the influence of the nonlinear effect, the order calculation value for a particular period fluctuates between the ideal values of two adjacent orders. Thus, the correct order value can be directly determined by acquiring the period characteristic information, without the need for complex error compensation. Simulations demonstrate that the method performs good robustness where random noise and luminance saturation exist simultaneously in addition to system nonlinearity. Our experiments confirm the effectiveness of this method for high-accurate and fast fringe order determination.</p></div>","PeriodicalId":722,"journal":{"name":"Optical Review","volume":"30 4","pages":"436 - 453"},"PeriodicalIF":1.1000,"publicationDate":"2023-06-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Optical Review","FirstCategoryId":"101","ListUrlMain":"https://link.springer.com/article/10.1007/s10043-023-00825-9","RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"OPTICS","Score":null,"Total":0}
引用次数: 0
Abstract
Temporal phase unwrapping based on phase-encoding is a technique widely used in 3D measurement for its high-speed advantage. However, eliminating fringe order jump error induced by the system’s luminance nonlinearity is still a key challenge. We propose a fringe order jump error self-correction method to address this issue. First, we encode the shifting phase and stair phase separately and combine them into the same pattern based on four-step phase shifting. This allows us to calculate the fringe order and wrapped phase simultaneously and avoid the overlapping of two set phases. Then, we add auxiliary patterns to obtain information on the order-located period’s odd-evenness characteristic. Theoretically, we demonstrate that under the influence of the nonlinear effect, the order calculation value for a particular period fluctuates between the ideal values of two adjacent orders. Thus, the correct order value can be directly determined by acquiring the period characteristic information, without the need for complex error compensation. Simulations demonstrate that the method performs good robustness where random noise and luminance saturation exist simultaneously in addition to system nonlinearity. Our experiments confirm the effectiveness of this method for high-accurate and fast fringe order determination.
期刊介绍:
Optical Review is an international journal published by the Optical Society of Japan. The scope of the journal is:
General and physical optics;
Quantum optics and spectroscopy;
Information optics;
Photonics and optoelectronics;
Biomedical photonics and biological optics;
Lasers;
Nonlinear optics;
Optical systems and technologies;
Optical materials and manufacturing technologies;
Vision;
Infrared and short wavelength optics;
Cross-disciplinary areas such as environmental, energy, food, agriculture and space technologies;
Other optical methods and applications.