Electrochemical capacitor temperature fluctuations during charging/discharging processes

IF 1 4区 工程技术 Q4 INSTRUMENTS & INSTRUMENTATION
S. Galla, A. Szewczyk, Ł. Lentka
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引用次数: 4

Abstract

The paper presents a proposal of using additional statistical parameters such as: standard deviation, variance, maximum and minimum increases of the observed value that were determined during measurements of temperature fields created on the surface of the tested electrochemical capacitor. The measurements were carried out using thermographic methods in order to support assessment of the condition of electrochemical capacitor under classic durability tests based on methods of determination of capacity and equivalent series resistance. The possibility of using some statistical parameters in assessment of the electrochemical capacitor quality was illustrated. The applied measurement methodology and the results of research associated with the classic methods of supercapacitors’ assessment are presented. The obtained results indicate that the variability of some statistical parameters of temperature fields can be directly related to changing the values of standard parameters describing electrochemical capacitor, which are capacitance and equivalent series resistance.
电化学电容器在充放电过程中的温度波动
本文提出了一种使用额外统计参数的建议,如:在测量测试电化学电容器表面产生的温度场时确定的观测值的标准差、方差、最大和最小增量。使用热成像方法进行测量,以支持在基于容量和等效串联电阻测定方法的经典耐久性测试下评估电化学电容器的状态。说明了在电化学电容器质量评估中使用一些统计参数的可能性。介绍了应用的测量方法以及与超级电容器评估经典方法相关的研究结果。研究结果表明,温度场的一些统计参数的可变性可能与描述电化学电容器的标准参数(电容和等效串联电阻)的值的变化直接相关。
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来源期刊
Metrology and Measurement Systems
Metrology and Measurement Systems INSTRUMENTS & INSTRUMENTATION-
CiteScore
2.00
自引率
10.00%
发文量
0
审稿时长
6 months
期刊介绍: Contributions are invited on all aspects of the research, development and applications of the measurement science and technology. The list of topics covered includes: theory and general principles of measurement; measurement of physical, chemical and biological quantities; medical measurements; sensors and transducers; measurement data acquisition; measurement signal transmission; processing and data analysis; measurement systems and embedded systems; design, manufacture and evaluation of instruments. The average publication cycle is 6 months.
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