{"title":"Structure relations in the family of the solid solution Hf x Zr1−x O2","authors":"M. Nentwich","doi":"10.1515/zkri-2021-2066","DOIUrl":null,"url":null,"abstract":"Abstract Hafnium Zirconium Oxide Hf x Zr1−x O2 is a potentially ferroelectric material with great perspectives in semiconductor applications, due to its compatibility with silicon technologies and its low toxicity. Despite its chemical simplicity, the solid solution Hf x Zr1−x O2 comprises a large variety of different phases. We compiled a complete list of experimentally and theoretically reported Hf x Zr1−x O2 structures. All of them are symmetrically related to the common aristotype with Fluorite type structure. The symmetry relationships between those structures have been determined and are presented in a Bärnighausen-like tree. Interestingly, not all symmetry reductions follow the conventional group-subgroup relations and involve severe atomic shifts. Further, the structures were compared to each other in detail regarding the dimensionality of atomic shifts and the accompanied lattice distortions. Finally, the information provided by the Bärnighausen-like tree was used to transform the indices of a reflection before and after a phase transition. This conversion allows the study of (dis)appearing reflections during phase transitions.","PeriodicalId":48676,"journal":{"name":"Zeitschrift Fur Kristallographie-Crystalline Materials","volume":"237 1","pages":"141 - 157"},"PeriodicalIF":0.9000,"publicationDate":"2022-02-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Zeitschrift Fur Kristallographie-Crystalline Materials","FirstCategoryId":"88","ListUrlMain":"https://doi.org/10.1515/zkri-2021-2066","RegionNum":4,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"CRYSTALLOGRAPHY","Score":null,"Total":0}
引用次数: 2
Abstract
Abstract Hafnium Zirconium Oxide Hf x Zr1−x O2 is a potentially ferroelectric material with great perspectives in semiconductor applications, due to its compatibility with silicon technologies and its low toxicity. Despite its chemical simplicity, the solid solution Hf x Zr1−x O2 comprises a large variety of different phases. We compiled a complete list of experimentally and theoretically reported Hf x Zr1−x O2 structures. All of them are symmetrically related to the common aristotype with Fluorite type structure. The symmetry relationships between those structures have been determined and are presented in a Bärnighausen-like tree. Interestingly, not all symmetry reductions follow the conventional group-subgroup relations and involve severe atomic shifts. Further, the structures were compared to each other in detail regarding the dimensionality of atomic shifts and the accompanied lattice distortions. Finally, the information provided by the Bärnighausen-like tree was used to transform the indices of a reflection before and after a phase transition. This conversion allows the study of (dis)appearing reflections during phase transitions.
摘要:氧化铪锆Hf x Zr1−x O2是一种潜在的铁电材料,由于其与硅技术的相容性和低毒性,在半导体应用中具有很大的前景。尽管其化学性质简单,但固溶体Hf x Zr1−x O2包含多种不同的相。我们编制了一份完整的实验和理论报道的Hf x Zr1−x O2结构列表。它们均与普通亚里斯多德型具有萤石型构造的对称关系。这些结构之间的对称关系已经确定,并在Bärnighausen-like树中表示。有趣的是,并不是所有的对称约简都遵循传统的群-子群关系,并涉及严重的原子位移。此外,还详细比较了两种结构的原子位移维度和晶格畸变。最后,利用Bärnighausen-like树提供的信息对反射在相变前后的指标进行变换。这种转换允许研究相变期间(不)出现的反射。
期刊介绍:
Zeitschrift für Kristallographie – Crystalline Materials was founded in 1877 by Paul von Groth and is today one of the world’s oldest scientific journals. It offers a place for researchers to present results of their theoretical experimental crystallographic studies. The journal presents significant results on structures and on properties of organic/inorganic substances with crystalline character, periodically ordered, modulated or quasicrystalline on static and dynamic phenomena applying the various methods of diffraction, spectroscopy and microscopy.