Evaluating Close Fit in Ordinal Factor Analysis Models With Multiply Imputed Data.

IF 2.1 3区 心理学 Q2 MATHEMATICS, INTERDISCIPLINARY APPLICATIONS
Educational and Psychological Measurement Pub Date : 2024-02-01 Epub Date: 2023-03-27 DOI:10.1177/00131644231158854
Dexin Shi, Bo Zhang, Ren Liu, Zhehan Jiang
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引用次数: 0

Abstract

Multiple imputation (MI) is one of the recommended techniques for handling missing data in ordinal factor analysis models. However, methods for computing MI-based fit indices under ordinal factor analysis models have yet to be developed. In this short note, we introduced the methods of using the standardized root mean squared residual (SRMR) and the root mean square error of approximation (RMSEA) to assess the fit of ordinal factor analysis models with multiply imputed data. Specifically, we described the procedure for computing the MI-based sample estimates and constructing the confidence intervals. Simulation results showed that the proposed methods could yield sufficiently accurate point and interval estimates for both SRMR and RMSEA, especially in conditions with larger sample sizes, less missing data, more response categories, and higher degrees of misfit. Based on the findings, implications and recommendations were discussed.

用多输入数据评价有序因子分析模型的紧密拟合
多重插值(Multiple imputation, MI)是处理有序因子分析模型中缺失数据的推荐技术之一。然而,在有序因子分析模型下计算基于mi的拟合指数的方法尚未开发。在这篇简短的文章中,我们介绍了使用标准化均方根残差(SRMR)和近似均方根误差(RMSEA)的方法来评估多重输入数据的有序因子分析模型的拟合。具体来说,我们描述了计算基于mi的样本估计和构造置信区间的过程。仿真结果表明,本文提出的方法对SRMR和RMSEA都能产生足够精确的点和区间估计,特别是在样本量较大、缺失数据较少、响应类别较多、失配程度较高的情况下。根据调查结果,讨论了影响和建议。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
Educational and Psychological Measurement
Educational and Psychological Measurement 医学-数学跨学科应用
CiteScore
5.50
自引率
7.40%
发文量
49
审稿时长
6-12 weeks
期刊介绍: Educational and Psychological Measurement (EPM) publishes referred scholarly work from all academic disciplines interested in the study of measurement theory, problems, and issues. Theoretical articles address new developments and techniques, and applied articles deal with innovation applications.
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