Research on the Adaptability of Thermistor Calibration Equations

IF 1.6 4区 工程技术 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC
Aiju Li, Haitao Wang, Liang Dong, Qiang Han, Meng Wen, Xiaodong Wen
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引用次数: 0

Abstract

Four different equations are used to fit the resistance-temperature relationship for negative temperature coefficient thermistor sensor in the range of 273.15~373.15 K. In order to obtain more general results, thermistors produced by four different manufacturers are selected for experiments. The fitting results by Hoge-2 and Hoge-3 equations are more consistent with the experimental results than S-H and R-C equations. As the amount of experiment data decreases, the fitting results of Hoge-3 equation gradually deviate from the experimental results, but it has little effect on the fitting results of Hoge-2 equation. In addition, the expression of the Hoge-2 equation is simpler than that of the Hoge-3 equation, so the Hoge-2 equation is recommended as the calibration equation for thermistors fitting.
热敏电阻标定方程的适应性研究
在273.15~373.15 K范围内,用四种不同的方程拟合了负温度系数热敏电阻传感器的电阻-温度关系。为了获得更一般的结果,选择了四个不同厂家生产的热敏电阻进行实验。Hoge-2和Hoge-3方程的拟合结果比S-H和R-C方程更符合实验结果。随着实验数据量的减少,Hoge-3方程的拟合结果逐渐偏离实验结果,但对Hoge-2方程的拟合结果影响不大。此外,Hoge-2方程的表达式比Hoge-3方程更简单,因此建议使用Hoge-2方程作为热敏电阻拟合的标定方程。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
IEEE Instrumentation & Measurement Magazine
IEEE Instrumentation & Measurement Magazine 工程技术-工程:电子与电气
CiteScore
4.20
自引率
4.80%
发文量
147
审稿时长
>12 weeks
期刊介绍: IEEE Instrumentation & Measurement Magazine is a bimonthly publication. It publishes in February, April, June, August, October, and December of each year. The magazine covers a wide variety of topics in instrumentation, measurement, and systems that measure or instrument equipment or other systems. The magazine has the goal of providing readable introductions and overviews of technology in instrumentation and measurement to a wide engineering audience. It does this through articles, tutorials, columns, and departments. Its goal is to cross disciplines to encourage further research and development in instrumentation and measurement.
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