D. Kopiec, W. Majstrzyk, B. Pruchnik, Ewelina Gacka, Dominik Badura, A. Sierakowski, P. Janus, T. Gotszalk
{"title":"Metrology and control of electromagnetically actuated cantilevers using optical beam deflection method","authors":"D. Kopiec, W. Majstrzyk, B. Pruchnik, Ewelina Gacka, Dominik Badura, A. Sierakowski, P. Janus, T. Gotszalk","doi":"10.24425/mms.2021.137698","DOIUrl":null,"url":null,"abstract":"In this paper, we present metrology and control methods and techniques for electromagnetically actuated microcantilevers. The electromagnetically actuated cantilevers belong to the micro electro mechanical systems (MEMS), which can be used in high resolution force and mass change investigations. In the described experiments, silicon cantilevers with an integrated Lorentz current loop were investigated. The electromag-netically actuated cantilevers were characterized using a modified optical beam deflection (OBD) system, whose architecture was optimized in order to increase its resolution. The sensitivity of the OBD system was calibrated using a reference cantilever, whose spring constant was determined through thermomechanical noise analysis registered interferometrically. The optimized and calibrated OBD system was used to observe the resonance and bidirectional static deflection of the electromagnetically deflected cantilevers. After theoretical analysis and further experiments, it was possible to obtain setup sensitivity equal to 5.28 mV/nm.","PeriodicalId":18394,"journal":{"name":"Metrology and Measurement Systems","volume":" ","pages":""},"PeriodicalIF":1.1000,"publicationDate":"2023-07-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Metrology and Measurement Systems","FirstCategoryId":"5","ListUrlMain":"https://doi.org/10.24425/mms.2021.137698","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"INSTRUMENTS & INSTRUMENTATION","Score":null,"Total":0}
引用次数: 1
Abstract
In this paper, we present metrology and control methods and techniques for electromagnetically actuated microcantilevers. The electromagnetically actuated cantilevers belong to the micro electro mechanical systems (MEMS), which can be used in high resolution force and mass change investigations. In the described experiments, silicon cantilevers with an integrated Lorentz current loop were investigated. The electromag-netically actuated cantilevers were characterized using a modified optical beam deflection (OBD) system, whose architecture was optimized in order to increase its resolution. The sensitivity of the OBD system was calibrated using a reference cantilever, whose spring constant was determined through thermomechanical noise analysis registered interferometrically. The optimized and calibrated OBD system was used to observe the resonance and bidirectional static deflection of the electromagnetically deflected cantilevers. After theoretical analysis and further experiments, it was possible to obtain setup sensitivity equal to 5.28 mV/nm.
期刊介绍:
Contributions are invited on all aspects of the research, development and applications of the measurement science and technology.
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