Photoelectron spectroscopy of ceria: Reduction, quantification and the myth of the vacancy peak in XPS analysis

IF 1.6 4区化学 Q4 CHEMISTRY, PHYSICAL

Surface and Interface Analysis Pub Date : 2023-09-04 DOI:10.1002/sia.7254

David J. Morgan

引用次数: 4

Abstract

Primarily due to its inherent redox chemistry, ceria (CeO2) is of use in many diverse areas of research. However, there is a wealth of misinterpretation of the oxygen spectra when discussing the result of damage or reduction to the CeO2 lattice, especially with regard to a signal in this region attributed to oxygen vacancies. In this paper, it is shown that this peak cannot be due to vacancies and that a better understanding of the changes in stoichiometry of CeO2 is best viewed from that of the Ce(III) component when considered in tandem with the O 1s signal.

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铈的光电子能谱:还原、定量和XPS分析中空位峰的神话

主要由于其固有的氧化还原化学性质，二氧化铈(CeO2)在许多不同的研究领域得到了应用。然而，在讨论CeO2晶格的损伤或还原的结果时，对氧谱有大量的误解，特别是关于该区域归因于氧空位的信号。本文表明，该峰不可能是由空位引起的，并且当与o1s信号串联考虑时，最好从Ce(III)组分的化学计量变化中更好地理解CeO2的化学计量变化。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

Surface and Interface Analysis 化学-物理化学

CiteScore

3.30

自引率

5.90%

发文量

130

审稿时长

4.4 months

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