Sulfur-rich carbon quantum dots based on Alternanthera philoxeroides and thiourea for the detection of tartrazine

IF 2.8 4区工程技术 Q2 ENGINEERING, ELECTRICAL & ELECTRONIC

Journal of Materials Science: Materials in Electronics Pub Date : 2022-05-21 DOI:10.1007/s10854-022-08226-5

Qihui Li, Haiying Du, Junrui Li, Jie Deng, Ruiyuan Wang, Yonglin Chen

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引用次数: 5

Abstract

Tartrazine is used as a synthetic colorant to improve the color of food. Excessive intake of tartrazine will seriously harm human health. In this paper, a green and facile one-pot hydrothermal approach is proposed for the preparation of sulfur-doped carbon quantum dots (S-CQDs) with Alternanthera philoxeroides (AP) powder and thiourea. The S-CQDs were developed as a highly sensitive “turn-off” fluorescent sensor for the detection of tartrazine. The S-CQDs displayed superior fluorescence characteristics of CQDs with a quantum yield (QY) up to 20.19%. S-CQDs exhibited the maximum fluorescence emission intensity at λ_em = 462 nm under excitation at λ_ex = 390 nm. The standard curve of S-CQDs had good linearity in the range of 7.8 ~ 125 μmol/L tartrazine, and the linear correlation coefficient (R²) was 0.9983. The S-CQDs were demonstrated to selectively react with tartrazine, leading to fluorescence quenching effect, which was successfully used for the detection of tartrazine with a limit of detection at 0.45 μmol/L, which was lower than the national standard detection limit of 187.14 μmol/L. The feasibility of practical application was assessed by the detection of tartrazine in real samples.

Abstract Image

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基于互花和硫脲的富硫碳量子点检测酒黄石

酒黄石被用作一种合成着色剂来改善食品的颜色。过量摄入酒黄石会严重危害人体健康。本文提出了一种绿色、简便的单锅水热法制备硫掺杂碳量子点(S-CQDs)的方法。S-CQDs是一种高灵敏度的“关断”荧光传感器，用于酒黄石的检测。S-CQDs具有较好的荧光特性，量子产率(QY)高达20.19%。在λex = 390 nm激发下，S-CQDs的最大荧光发射强度为λem = 462 nm。S-CQDs标准曲线在7.8 ~ 125 μmol/L酒石黄范围内线性良好，线性相关系数(R2)为0.9983。S-CQDs与酒黄石选择性反应，产生荧光猝灭效应，成功用于酒黄石的检测，检出限为0.45 μmol/L，低于国标检出限187.14 μmol/L。通过实际样品中酒黄石的检测，评价了实际应用的可行性。

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来源期刊

Journal of Materials Science: Materials in Electronics 工程技术-材料科学：综合

CiteScore

5.00

自引率

7.10%

发文量

1931

审稿时长

2 months

期刊介绍： The Journal of Materials Science: Materials in Electronics is an established refereed companion to the Journal of Materials Science. It publishes papers on materials and their applications in modern electronics, covering the ground between fundamental science, such as semiconductor physics, and work concerned specifically with applications. It explores the growth and preparation of new materials, as well as their processing, fabrication, bonding and encapsulation, together with the reliability, failure analysis, quality assurance and characterization related to the whole range of applications in electronics. The Journal presents papers in newly developing fields such as low dimensional structures and devices, optoelectronics including III-V compounds, glasses and linear/non-linear crystal materials and lasers, high Tc superconductors, conducting polymers, thick film materials and new contact technologies, as well as the established electronics device and circuit materials.