A study on the calibration of an HPM meter based on a D-dot sensor and logarithmic RF power detector

IF 1 4区 工程技术 Q4 INSTRUMENTS & INSTRUMENTATION
J. Jakubowski
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引用次数: 1

Abstract

HPM meters are required for the assessment of fields generated by sources of high-power microwaves. Finding the inverse calibration curves for such instruments is important for ensuring accuracy. The procedure is relatively simple for meters consisting of linear devices but there can also be hardware solutions implementing nonlinear ones. The objective of the present work was to develop a convenient procedure to allow finding such a curve when the meter uses a D-dot probe and a power detector. For that purpose, the results of low voltage measurements describing the properties of the detector were first analysed. Then a software code was developed to estimate the RMS value of an incident field based on measured output and frequency response. The response was estimated with very low electric field. And finally, the performance of the proposed procedure was verified by tests conducted with high electric field in a TEM cell. High conformity of the output of the meter with fields of known values was demonstrated. The maximum error related to the meter range did not exceed 4%.
基于d点传感器和对数射频功率检测器的HPM计标定研究
HPM计用于评估高功率微波源产生的场。找到这类仪器的反校准曲线对保证精度很重要。对于由线性器件组成的仪表,该过程相对简单,但也可以采用实现非线性器件的硬件解决方案。本工作的目的是开发一种方便的程序,允许在仪表使用d点探针和功率检测器时找到这样的曲线。为此,首先分析了描述探测器特性的低电压测量结果。然后开发了一个软件代码,根据测量输出和频率响应估计入射场的均方根值。用很低的电场估计了响应。最后,在TEM电池中进行了高电场测试,验证了该方法的性能。证明了该仪表的输出与已知值场的高度一致性。与仪表量程相关的最大误差不超过4%。
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来源期刊
Metrology and Measurement Systems
Metrology and Measurement Systems INSTRUMENTS & INSTRUMENTATION-
CiteScore
2.00
自引率
10.00%
发文量
0
审稿时长
6 months
期刊介绍: Contributions are invited on all aspects of the research, development and applications of the measurement science and technology. The list of topics covered includes: theory and general principles of measurement; measurement of physical, chemical and biological quantities; medical measurements; sensors and transducers; measurement data acquisition; measurement signal transmission; processing and data analysis; measurement systems and embedded systems; design, manufacture and evaluation of instruments. The average publication cycle is 6 months.
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