An EMI susceptibility study of different integrated operational transconductance amplifiers

IF 1 4区工程技术 Q4 ENGINEERING, ELECTRICAL & ELECTRONIC

Journal of Electrical Engineering-elektrotechnicky Casopis Pub Date : 2023-02-01 DOI:10.2478/jee-2023-0002

D. Krolák, P. Horský

引用次数: 0

Abstract

Abstract This paper presents a comparative EMI susceptibility study of different integrated operational transconductance amplifier (OTA) topologies. We analyzed conventional well-known amplifier topologies based on the Miller OTA and folded cascode concepts with lower power consumption. The output dc voltage shifts induced by power supply and input common mode high frequency disturbances are presented. On top of the EMI susceptibility comparison, we discuss PSRR and CMRR within large and small excitation signal with a new simulation setup. Even more, the back-gate connections of differential MOS pair in OTA input stage are investigated for EMI susceptibility impact as well.

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不同集成运算跨导放大器的EMI敏感性研究

摘要本文对不同集成运算跨导放大器（OTA）拓扑结构的EMI易感性进行了比较研究。我们分析了基于Miller OTA和具有较低功耗的折叠级联概念的传统众所周知的放大器拓扑。给出了电源和输入共模高频扰动引起的输出直流电压偏移。在EMI磁化率比较的基础上，我们用一种新的模拟装置讨论了大激励信号和小激励信号中的PSRR和CMRR。此外，还研究了OTA输入级中差分MOS对的背栅连接对EMI易感性的影响。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

Journal of Electrical Engineering-elektrotechnicky Casopis 工程技术-工程：电子与电气

CiteScore

1.70

自引率

12.50%

发文量

审稿时长

6-12 weeks

期刊介绍： The joint publication of the Slovak University of Technology, Faculty of Electrical Engineering and Information Technology, and of the Slovak Academy of Sciences, Institute of Electrical Engineering, is a wide-scope journal published bimonthly and comprising. -Automation and Control- Computer Engineering- Electronics and Microelectronics- Electro-physics and Electromagnetism- Material Science- Measurement and Metrology- Power Engineering and Energy Conversion- Signal Processing and Telecommunications