Analytical Multi-Parametric Design Optimization for the Miniaturization of Flip-Chip Package

IF 2.2 4区 工程技术 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC
Fei Chong Ng, M. A. Abas
{"title":"Analytical Multi-Parametric Design Optimization for the Miniaturization of Flip-Chip Package","authors":"Fei Chong Ng, M. A. Abas","doi":"10.1115/1.4052920","DOIUrl":null,"url":null,"abstract":"\n Recent advances in the microelectronics industry have increased the demand for smaller and more compact package devices with higher performance. This paper presents an analytical multi-parametric design optimization approach for the miniaturization of flip-chip package, while considering the filling time of the subsequent underfill encapsulation process. The design optimization approach was based on the latest regional segregation-based analytical filling time model. Numerical simulation was conducted to verify the governed analytical model. The discrepancies in filling times are less than 9.9% and the predicted critical bump pitch has a low deviation of 4.1%, affirming that both the analytical and numerical models were in great consensus. The variation effects of bump pitch, gap height and contact angle on the filling time were analysed and discussed thoroughly. Both the critical bump pitch and the critical gap height were computed and fitted into respective empirical equations. Subsequently, a new multi-parametric design optimization approach based on the thresholding and criticality of underfill parameters was proposed to determine the optimum parameters that yield to the most compact flip-chip package with acceptable low filling time during the encapsulation process. Lastly, this proposed optimization technique was tested on the four flip-chips used in a previously published underfill experiment.","PeriodicalId":15663,"journal":{"name":"Journal of Electronic Packaging","volume":" ","pages":""},"PeriodicalIF":2.2000,"publicationDate":"2021-11-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Electronic Packaging","FirstCategoryId":"5","ListUrlMain":"https://doi.org/10.1115/1.4052920","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 1

Abstract

Recent advances in the microelectronics industry have increased the demand for smaller and more compact package devices with higher performance. This paper presents an analytical multi-parametric design optimization approach for the miniaturization of flip-chip package, while considering the filling time of the subsequent underfill encapsulation process. The design optimization approach was based on the latest regional segregation-based analytical filling time model. Numerical simulation was conducted to verify the governed analytical model. The discrepancies in filling times are less than 9.9% and the predicted critical bump pitch has a low deviation of 4.1%, affirming that both the analytical and numerical models were in great consensus. The variation effects of bump pitch, gap height and contact angle on the filling time were analysed and discussed thoroughly. Both the critical bump pitch and the critical gap height were computed and fitted into respective empirical equations. Subsequently, a new multi-parametric design optimization approach based on the thresholding and criticality of underfill parameters was proposed to determine the optimum parameters that yield to the most compact flip-chip package with acceptable low filling time during the encapsulation process. Lastly, this proposed optimization technique was tested on the four flip-chips used in a previously published underfill experiment.
倒装芯片封装小型化的多参数分析设计优化
微电子工业的最新进展增加了对具有更高性能的更小、更紧凑的封装器件的需求。本文提出了一种用于倒装芯片封装小型化的分析性多参数设计优化方法,同时考虑了后续底部填充封装工艺的填充时间。设计优化方法基于最新的基于区域分离的分析填充时间模型。进行了数值模拟以验证所控制的分析模型。填充时间的差异小于9.9%,预测的临界凸点间距具有4.1%的低偏差,这证实了分析模型和数值模型都是非常一致的。深入分析和讨论了凸点间距、间隙高度和接触角对填充时间的影响。计算了临界凸点间距和临界间隙高度,并将其拟合到各自的经验方程中。随后,提出了一种基于底充参数阈值和临界值的新的多参数设计优化方法,以确定在封装过程中以可接受的低填充时间产生最紧凑倒装芯片封装的最佳参数。最后,在先前发表的底部填充实验中使用的四个倒装芯片上测试了所提出的优化技术。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
Journal of Electronic Packaging
Journal of Electronic Packaging 工程技术-工程:电子与电气
CiteScore
4.90
自引率
6.20%
发文量
44
审稿时长
3 months
期刊介绍: The Journal of Electronic Packaging publishes papers that use experimental and theoretical (analytical and computer-aided) methods, approaches, and techniques to address and solve various mechanical, materials, and reliability problems encountered in the analysis, design, manufacturing, testing, and operation of electronic and photonics components, devices, and systems. Scope: Microsystems packaging; Systems integration; Flexible electronics; Materials with nano structures and in general small scale systems.
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信