PENERAPAN HAZARD ANALYSIS AND CRITICAL CONTROL POINT (HACCP) PADA PROSES PRODUKSI WAFER ROLL [Implementation of Hazard Analysis and Critical Control Point (HACCP) in Production of Wafer Roll]

A. Citraresmi, F. P. Putri
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引用次数: 2

Abstract

The purpose of this study was to determine the application of Hazard Analysis and Critical Control Points (HACCP) to identify and prevent potential hazards in the production process of chocolate roll wafers at PT. X.  The production process of wafer roll at PT. X consisted of mixing raw materials, filtering, roasting, rolling a wafer roll, filling cream, cutting, decreasing wafer roll temperature, packaging, and X-ray detection.  The implementation of a quality assurance system must be carried out at every stage of processes to prevent microbiological chemical, and physical hazard pollution, and maintaining product quality.  The study was conducted using a survey method, by directly following the entire process of making chocolate roll wafers from the receiving of raw materials to the final product in the packaging.  The data was analyzed using descriptive analysis method.  The application of the HACCP system at PT. X through two steps, that were preliminary hazard analysis step and hazard analysis step.  The results showed that the X-ray detection pathway found CCP contamination of foreign objects with significant hazards in the form of metal parts in the product.  Preventive actions taken included separating and marking deviant products, repairing the auto stop system, and visual observation by employees on X-ray detection machines.
危害分析与关键控制点(HACCP) PADA处理硅片卷[危害分析与关键控制点(HACCP)在硅片卷生产中的实施]
本研究的目的是确定危害分析和关键控制点(HACCP)的应用,以识别和预防PT.X巧克力卷晶圆生产过程中的潜在危害。PT.X晶圆卷的生产过程包括混合原料、过滤、烘焙、轧制晶圆卷、填充奶油、切割,降低晶片辊温度、封装和X射线检测。必须在工艺的每个阶段实施质量保证体系,以防止微生物化学和物理危害污染,并保持产品质量。这项研究采用了一种调查方法,直接跟踪了巧克力卷晶圆的整个制作过程,从接收原材料到包装中的最终产品。数据采用描述性分析方法进行分析。HACCP体系在PT.X的应用分为两个步骤,即初步危害分析步骤和危害分析步骤。结果表明,X射线检测途径发现CCP污染了产品中金属部件形式的具有重大危害的异物。所采取的预防措施包括分离和标记异常产品,修理自动停止系统,以及员工在X射线检测机上进行目视观察。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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