Performance limits of high voltage press-pack SiC IGBT and SiC MOSFET devices

Lubin Han , Lin Liang , Yijian Wang , Xinling Tang , Song Bai
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引用次数: 2

Abstract

Considering the switching frequency limit and electromagnetic interference, the selection of high voltage SiC IGBT and SiC MOSFET is confusing due to punch-through effect and bipolar characteristics of SiC IGBT. The thermal resistance, static characteristics and dynamic characteristics of SiC IGBT and SiC MOSFET module with Press-Pack packaging are measured to evaluate the switching frequency limit and electromagnetic interfere of them. The tradeoffs of SiC IGBT between switching frequency limit and electromagnetic interfere are less attractive due to the intrinsic characteristics, such as high power loss and punch-through effect. The possible solutions for SiC IGBT are proposed based on the improvement of driving resistor and driving voltage.

Abstract Image

高压压封装SiC IGBT和SiC MOSFET器件的性能限制
考虑到开关频率限制和电磁干扰,由于SiC IGBT的穿孔效应和双极特性,高压SiC IGBT和SiC MOSFET的选择比较混乱。测量了采用Press-Pack封装的SiC IGBT和SiC MOSFET模块的热阻、静态特性和动态特性,评估了它们的开关频率限制和电磁干扰。SiC IGBT由于其固有的特性,如高功率损耗和穿孔效应,在开关频率限制和电磁干扰之间的权衡不太有吸引力。从改进驱动电阻和驱动电压两方面提出了SiC IGBT的解决方案。
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来源期刊
Power electronic devices and components
Power electronic devices and components Hardware and Architecture, Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics, Safety, Risk, Reliability and Quality
CiteScore
2.00
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0.00%
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