Reliability Behavior of A Resin-Free Nanosilver Paste at Ultra-Low Temperature of 180°C

Bowen Zhang , Shi Chen , Guo-Quan. Lu , Yun-Hui. Mei
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引用次数: 2

Abstract

In this paper, excellent thermo-mechanical reliability of resin-free silver sintering for large-area (20 × 20 mm2) bonding was successfully achieved by using a trimodal particle system composed of nano-, submicron-, and micron-sized Ag particles. After 1000 cycles of the thermal shock (TS) test, the transient thermal impedance (Zth) increase of the proposed resin-free silver paste sintered at 180°C under 2 MPa and 5 MPa is only 5.8% and 6.1%, respectively. Due to the avoidance of resin degradation, the obtained resin-free silver paste as-sintered under 5 MPa exhibt outstanding shear strength (>12.5 MPa) even after 1000 cycles TS test. The obtained cross-sectional microstructure can confirms the excellent thermo-mechanical reliability of the sintered resin-free silver paste, which exhibits a denser and more homogeneous bonding layer with a porosity as low as 12.5%. Furthermore, distinct indications of plastic flow can be observed on the fracture surfaces of corresponding joints before and after aging, which further confirm the superiority of proposed resin-free sintering method. The development of novel resin-free silver paste successfully promotes the thermo-mechanical reliability of silicon carbide (SiC) power devices at a low processing temperature of 180°C, and greatly benefits the practical application of SiC power devices.

Abstract Image

超低温180℃下无树脂纳米银浆料的可靠性行为
本文采用纳米、亚微米和微米尺寸的银粒子组成的三模态粒子体系,成功地实现了无树脂银烧结大面积(20 × 20 mm2)键合的优异热机械可靠性。经过1000次热冲击(TS)试验,在2 MPa和5 MPa下180℃烧结的无树脂银浆的瞬态热阻抗(Zth)增幅分别仅为5.8%和6.1%。由于避免了树脂的降解,制备的无树脂银浆在5 MPa下烧结,即使经过1000次TS试验,仍具有优异的抗剪强度(>12.5 MPa)。所获得的横截面微观结构证实了烧结后无树脂银浆具有良好的热机械可靠性,其结合层更加致密均匀,孔隙率低至12.5%。在相应接头的断口处,时效前后均可观察到明显的塑性流动迹象,进一步证实了所提出的无树脂烧结方法的优越性。新型无树脂银浆的研制成功提高了碳化硅(SiC)功率器件在180℃低加工温度下的热机械可靠性,极大地有利于SiC功率器件的实际应用。
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来源期刊
Power electronic devices and components
Power electronic devices and components Hardware and Architecture, Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics, Safety, Risk, Reliability and Quality
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