Chun-Yan Tang, Lei Liu, Kai Ke, Bo Yin, Ming-Bo Yang, Wei Yang
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引用次数: 1
Abstract
Electrically conductive elastomer composites (CECs) with segregated networks of conductive nanofillers show high potential in stretchable strain sensors due to balanced mechanical and electrical properties, yet the sensitivity at low strain is generally insufficient for practical application. Herein, we report an easy and effective way to improve the resistive response to low strain for CECs with segregated network structure via adding stiff alumina into carbon nanostructures (CNS). The CEC containing 0.7 wt% CNS and 5 wt% Al2O3 almost sustains the same elasticity (elongation at break of ∼900%) and conductivity (0.8 S/m) as the control, while the piezoresistive sensitivity is significantly improved. Thermoplastic polyurethane (TPU) composites with a segregated network of hybrid nanofillers (CNS and Al2O3) show much higher strain sensitivity (Gauge factor, GF = 566) at low strain (45% strain) due to a local stress concentration effect, this sensitivity is superior to that of TPU/CNS composites (GF = 11). Such a local stress concentration effect depends on alumina content and its distribution at the TPU particle interface. In addition, CECs with hybrid fillers show better reproducibility in cyclic piezoresistive behavior testing than the control. This work offers an easy method for fabricating CECs with a segregated filler network offering stretchable strain sensors with a high strain sensitivity.
期刊介绍:
Nano Materials Science (NMS) is an international and interdisciplinary, open access, scholarly journal. NMS publishes peer-reviewed original articles and reviews on nanoscale material science and nanometer devices, with topics encompassing preparation and processing; high-throughput characterization; material performance evaluation and application of material characteristics such as the microstructure and properties of one-dimensional, two-dimensional, and three-dimensional nanostructured and nanofunctional materials; design, preparation, and processing techniques; and performance evaluation technology and nanometer device applications.