{"title":"TC-01: Nondestructive Evaluation and Industrial Inspection (NDE&II)","authors":"James A. Smith, H. Ramos","doi":"10.1109/mim.2023.10217028","DOIUrl":null,"url":null,"abstract":"This short column is to remind IEEE Instrumentation & Measurement Magazine readers about the technical and industrial opportunities offered by Technical Committee-01. The Nondestructive Evaluation and Industrial Inspection (NDE&II) technical committee was formed in 2018 to address the needs of the NDE community of the IEEE Instrumentation and Measurement Society (IMS). The NDE&II TC is designed to engage and cross-pollinate the technical and industrial communities. The resulting interactions will lead to technical innovations that solve industrial applications.","PeriodicalId":55025,"journal":{"name":"IEEE Instrumentation & Measurement Magazine","volume":null,"pages":null},"PeriodicalIF":1.6000,"publicationDate":"2023-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Instrumentation & Measurement Magazine","FirstCategoryId":"5","ListUrlMain":"https://doi.org/10.1109/mim.2023.10217028","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
This short column is to remind IEEE Instrumentation & Measurement Magazine readers about the technical and industrial opportunities offered by Technical Committee-01. The Nondestructive Evaluation and Industrial Inspection (NDE&II) technical committee was formed in 2018 to address the needs of the NDE community of the IEEE Instrumentation and Measurement Society (IMS). The NDE&II TC is designed to engage and cross-pollinate the technical and industrial communities. The resulting interactions will lead to technical innovations that solve industrial applications.
期刊介绍:
IEEE Instrumentation & Measurement Magazine is a bimonthly publication. It publishes in February, April, June, August, October, and December of each year. The magazine covers a wide variety of topics in instrumentation, measurement, and systems that measure or instrument equipment or other systems. The magazine has the goal of providing readable introductions and overviews of technology in instrumentation and measurement to a wide engineering audience. It does this through articles, tutorials, columns, and departments. Its goal is to cross disciplines to encourage further research and development in instrumentation and measurement.