XPS Al Kα and high energy x-ray photoelectron spectroscopy (HAXPES) Cr Kα measurement of bulk boron

IF 1.6 Q3 PHYSICS, CONDENSED MATTER
C. Zborowski, A. Vanleenhove, I. Hoflijk, I. Vaesen, K. Artyushkova, T. Conard
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引用次数: 0

Abstract

Bulk boron was analyzed using both XPS and high-resolution high energy x-ray photoelectron spectroscopy. The spectra of boron obtained using monochromatic Al Kα radiation include survey scan and high-resolution spectra of B 1s, O 1s, N 1s, C 1s, and Ar 2p. The Cr Kα spectra with radiation at 5414.8 eV include survey scan and high-resolution spectra of B 1s, O 1s, N 1s, C 1s, Ar 2p, and Ar 1s.
XPS Al Kα和高能x射线光电子能谱(HAXPES) Cr Kα测量体硼
使用XPS和高分辨率高能x射线光电子能谱对大块硼进行了分析。使用单色Al Kα辐射获得的硼光谱包括测量扫描和Bs、O1s、N1s、C1s和Ar2p的高分辨率光谱。5414.8辐射下的Cr Kα光谱 eV包括Bs、O1s、N1s、C1s、Ar2p和Ar1s的测量扫描和高分辨率光谱。
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来源期刊
Surface Science Spectra
Surface Science Spectra PHYSICS, CONDENSED MATTER-
CiteScore
1.90
自引率
7.70%
发文量
36
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