An improved algorithm for the series step-up method based on a linear three-ports network

IF 1 4区 工程技术 Q4 INSTRUMENTS & INSTRUMENTATION
Hao Liu, Lixue Chen, Xue Wang, Teng Yao, Xiong Gu
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引用次数: 1

Abstract

Capacitive leakage and adjacent interference are the main influence sources of the measuring error in the traditional series step-up method. To solve the two problems, a new algorithm was proposed in this study based on a three-ports network. Considering the two influences, it has been proved that response of this three-ports network still has characteristics of linear superposition with this new algorithm. In this three-port network, the auxiliary series voltage transformers use a two-stage structure that can further decrease measurement uncertainty. The measurement uncertainty of this proposed method at 500/ √ 3 kV is 6.8 ppm for ratio error and 7 μ rad for phase displacement ( 𝑘 = 2). This new method has also been verified by comparing its results with measurement results of the PTB in Germany over the same 110 /√ 3 kV standard voltage transformer. According to test results, the error between the two methods was less than 2.7 ppm for ratio error and 2.9 μ rad for phase displacement.
基于线性三端口网络的串联升压法的改进算法
电容泄漏和相邻干扰是传统串联升压法测量误差的主要影响因素。为了解决这两个问题,本文提出了一种基于三端口网络的新算法。考虑到这两方面的影响,证明了新算法对三端口网络的响应仍然具有线性叠加的特点。在这种三端口网络中,辅助串联电压互感器采用两级结构,可以进一步降低测量不确定度。该方法在500/√3 kV电压下的测量不确定度为6.8 ppm,相位误差为7 μ rad(𝑘= 2)。通过与德国PTB在相同的110 /√3 kV标准电压互感器上的测量结果进行比较,验证了该方法的正确性。实验结果表明,两种方法的比值误差小于2.7 ppm,相移误差小于2.9 μ rad。
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来源期刊
Metrology and Measurement Systems
Metrology and Measurement Systems INSTRUMENTS & INSTRUMENTATION-
CiteScore
2.00
自引率
10.00%
发文量
0
审稿时长
6 months
期刊介绍: Contributions are invited on all aspects of the research, development and applications of the measurement science and technology. The list of topics covered includes: theory and general principles of measurement; measurement of physical, chemical and biological quantities; medical measurements; sensors and transducers; measurement data acquisition; measurement signal transmission; processing and data analysis; measurement systems and embedded systems; design, manufacture and evaluation of instruments. The average publication cycle is 6 months.
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