Second-Order Correlation Measurement for Single-Photon Metrology

IF 1 4区工程技术 Q4 INSTRUMENTS & INSTRUMENTATION

MAPAN Pub Date : 2023-08-09 DOI:10.1007/s12647-023-00676-4

Anish Mahavir Bhargav, Abdul Wahid, Samaresh Das, Venu Gopal Achanta

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引用次数: 0

Abstract

The critical aspect in the field of single-photon metrology is to measure the detector efficiency with the lowest possible uncertainty and reproducibility. The developments in quantum technologies have paved the way for applications such as quantum imaging and quantum information processing, including quantum computing and quantum communications proving superior to the conventional technologies currently in use. Superconducting Nanowire Single-Photon Detectors (SNSPDs) are one of the key elements in these applications and are preferred over similar devices due to their better performance parameters. The instrumentation used for characterizing single-photon detectors must be precise and reliable so that no optical event gets missed. Here, we present an optical setup based on the 2nd-order correlation measurement, developed to characterize single-photon detectors at visible to near-infrared wavelengths. Each device used in the setup has been thoroughly characterized, and their response under different operating conditions has been studied. In the setup, a few photons generated by attenuating a laser are split by a 50:50 fiber beam splitter and sent to two single-photon detectors. A correlation card measures the coincidences.

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单光子计量的二阶相关测量

单光子计量领域的关键方面是以尽可能低的不确定性和再现性来测量探测器效率。量子技术的发展为量子成像和量子信息处理等应用铺平了道路，包括量子计算和量子通信，证明它们优于目前使用的传统技术。超导纳米线单光子探测器（SNSPD）是这些应用中的关键元件之一，并且由于其更好的性能参数而优于类似器件。用于表征单光子探测器的仪器必须精确可靠，这样就不会错过任何光学事件。在这里，我们提出了一种基于二阶相关测量的光学装置，该装置用于表征可见光至近红外波长的单光子探测器。该装置中使用的每个装置都经过了彻底的表征，并研究了它们在不同操作条件下的响应。在该设置中，通过衰减激光产生的几个光子被50:50光纤分束器分离，并发送到两个单光子探测器。一张相关卡片可以测量巧合。

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来源期刊

MAPAN 工程技术-物理：应用

CiteScore

2.30

自引率

20.00%

发文量

审稿时长

3 months

期刊介绍： MAPAN-Journal Metrology Society of India is a quarterly publication. It is exclusively devoted to Metrology (Scientific, Industrial or Legal). It has been fulfilling an important need of Metrologists and particularly of quality practitioners by publishing exclusive articles on scientific, industrial and legal metrology. The journal publishes research communication or technical articles of current interest in measurement science; original work, tutorial or survey papers in any metrology related area; reviews and analytical studies in metrology; case studies on reliability, uncertainty in measurements; and reports and results of intercomparison and proficiency testing.