Albedo measurements and energy yield estimation uncertainty for bifacial photovoltaic systems

IF 8 2区 材料科学 Q1 ENERGY & FUELS
Pablo Merodio, Francisco Martínez-Moreno, Rodrigo Moretón, Eduardo Lorenzo
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引用次数: 1

Abstract

The deployment of bifacial photovoltaic (PV) modules for utility-scale PV plants has quickly proliferated in recent years. As they can harness the irradiance received at the rear side of bifacial generators—which depends on the albedo of the reflector ground—bifacial modules provide higher productivity than monofacial modules, in exchange for a low increase in manufacturing costs. However, the reduction of PV performance estimations uncertainty still represents a main concern for both PV and financial actors, which seek to reduce financial risks of bifacial PV systems. The aim of this work is to provide a better understanding of the impact that albedo measurements have on PV yield estimations uncertainty. We analysed the albedo sensitivity coefficient relating albedo measurement and subsequent energy yield estimations' uncertainties through a representative yield simulation exercise performed for three different sites (Chile, Spain and Sweden) and two types of PV plants: static and single-axis tracker. A formula considering the impact of Ground Coverage Ratio and Inverter Loading Ratio is proposed for this coefficient. We performed an experimental campaign to evaluate the uncertainty associated to different albedo measurement conditions. Surface reflectance of five different ground surfaces has been measured using four sensors, which allowed to obtain three useful types of albedos that we defined and described. A series of recommendations for short-term ground-based albedo measurements that entail a maximum of 1.5% yield uncertainty contribution in the frame of commercial PV plants are then derived. A representative case of actual albedo measurement practices at the current PV market scene is also presented in the form of a commercial albedo measurement project for a future 50 MW bifacial PV plant. Despite being a local characteristic, the most relevant uncertainty source found is associated to the non-homogeneity of the future PV plant's surface. An important consideration is that changes in the use of land caused by the construction of a PV plant lead to an albedo uncertainty that predominates over all the uncertainty sources associated to the albedo measurement conditions. This can also be the case for long-term seasonal variations, which can become the dominant uncertainty source for high latitude locations.

Abstract Image

双面光伏系统的反照率测量和能量产额估计的不确定度
近年来,用于公用事业规模光伏电站的双面光伏组件的部署迅速激增。由于它们可以利用双面发电机后侧接收到的辐照度(这取决于反射地面的反照率),因此双面模块比单面模块提供了更高的生产力,以换取制造成本的低增长。然而,光伏性能估计不确定性的降低仍然是光伏和金融参与者的主要担忧,他们寻求降低双面光伏系统的财务风险。这项工作的目的是更好地了解反照率测量对光伏发电量估计不确定性的影响。我们通过对三个不同地点(智利、西班牙和瑞典)和两种类型的光伏电站(静态和单轴跟踪器)进行的具有代表性的产量模拟,分析了与反照率测量和后续能源产量估计相关的反照率敏感系数的不确定性。针对该系数,提出了一个考虑接地覆盖率和逆变器负载率影响的公式。我们进行了一项实验活动,以评估与不同反照率测量条件相关的不确定性。使用四个传感器测量了五个不同地表的表面反射率,从而获得了我们定义和描述的三种有用类型的反照率。然后得出了一系列关于短期地面反照率测量的建议,这些建议在商业光伏发电厂的框架内导致最大1.5%的产量不确定性贡献。还以未来50年商业反照率测量项目的形式介绍了当前光伏市场实际反照率测试实践的一个代表性案例 MW双面光伏发电厂。尽管这是一个局部特征,但发现的最相关的不确定性源与未来光伏电站表面的不均匀性有关。一个重要的考虑因素是,光伏发电厂建设导致的土地利用变化导致反照率不确定性,该不确定性占与反照率测量条件相关的所有不确定性来源的主导地位。长期季节变化也可能是这种情况,这可能成为高纬度地区的主要不确定性来源。
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来源期刊
Progress in Photovoltaics
Progress in Photovoltaics 工程技术-能源与燃料
CiteScore
18.10
自引率
7.50%
发文量
130
审稿时长
5.4 months
期刊介绍: Progress in Photovoltaics offers a prestigious forum for reporting advances in this rapidly developing technology, aiming to reach all interested professionals, researchers and energy policy-makers. The key criterion is that all papers submitted should report substantial “progress” in photovoltaics. Papers are encouraged that report substantial “progress” such as gains in independently certified solar cell efficiency, eligible for a new entry in the journal''s widely referenced Solar Cell Efficiency Tables. Examples of papers that will not be considered for publication are those that report development in materials without relation to data on cell performance, routine analysis, characterisation or modelling of cells or processing sequences, routine reports of system performance, improvements in electronic hardware design, or country programs, although invited papers may occasionally be solicited in these areas to capture accumulated “progress”.
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