{"title":"An End-to-End Deep Learning Approach for State Recognition of Multifunction Radars.","authors":"Xinsong Xu, Daping Bi, Jifei Pan","doi":"10.3390/s22134980","DOIUrl":null,"url":null,"abstract":"<p><p>With the widespread use of multifunction radars (MFRs), it is hard for the traditional radar signal recognition technology to meet the needs of current electronic intelligence systems. For signal recognition of an MFR, it is necessary to identify not only the type or individual of the emitter but also its current state. Existing methods identify MFR states through hierarchical modeling, but most of them rely heavily on prior information. In the paper, we focus on the MFR state recognition with actual intercepted MFR signals and develop it by introducing recurrent neural networks (RNNs) of deep learning into the modeling of MFR signals. According to the layered MFR signal architecture, we propose a novel end-to-end state recognition approach with two RNNs' connections. This approach makes full use of RNNs' ability to directly tackle corrupted data and automatically learn the features from input data. So, it is practical and less dependent on prior information. In addition, the hierarchical modeling method applied to the end-to-end network effectively restricts the scale of the end-to-end model so that the model can be trained with a small amount of data. Simulation results on a real MFR show the excellent recognition performance of our end-to-end approach with little prior information.</p>","PeriodicalId":3,"journal":{"name":"ACS Applied Electronic Materials","volume":" ","pages":""},"PeriodicalIF":4.3000,"publicationDate":"2022-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9269791/pdf/","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"ACS Applied Electronic Materials","FirstCategoryId":"103","ListUrlMain":"https://doi.org/10.3390/s22134980","RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 1
Abstract
With the widespread use of multifunction radars (MFRs), it is hard for the traditional radar signal recognition technology to meet the needs of current electronic intelligence systems. For signal recognition of an MFR, it is necessary to identify not only the type or individual of the emitter but also its current state. Existing methods identify MFR states through hierarchical modeling, but most of them rely heavily on prior information. In the paper, we focus on the MFR state recognition with actual intercepted MFR signals and develop it by introducing recurrent neural networks (RNNs) of deep learning into the modeling of MFR signals. According to the layered MFR signal architecture, we propose a novel end-to-end state recognition approach with two RNNs' connections. This approach makes full use of RNNs' ability to directly tackle corrupted data and automatically learn the features from input data. So, it is practical and less dependent on prior information. In addition, the hierarchical modeling method applied to the end-to-end network effectively restricts the scale of the end-to-end model so that the model can be trained with a small amount of data. Simulation results on a real MFR show the excellent recognition performance of our end-to-end approach with little prior information.
期刊介绍:
ACS Applied Electronic Materials is an interdisciplinary journal publishing original research covering all aspects of electronic materials. The journal is devoted to reports of new and original experimental and theoretical research of an applied nature that integrate knowledge in the areas of materials science, engineering, optics, physics, and chemistry into important applications of electronic materials. Sample research topics that span the journal's scope are inorganic, organic, ionic and polymeric materials with properties that include conducting, semiconducting, superconducting, insulating, dielectric, magnetic, optoelectronic, piezoelectric, ferroelectric and thermoelectric.
Indexed/Abstracted:
Web of Science SCIE
Scopus
CAS
INSPEC
Portico