High-resolution Compton spectroscopy using x-ray microcalorimeters.

U Patel, T Guruswamy, A J Krzysko, H Charalambous, L Gades, K Wiaderek, O Quaranta, Y Ren, A Yakovenko, U Ruett, A Miceli
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引用次数: 1

Abstract

X-ray Compton spectroscopy is one of the few direct probes of the electron momentum distribution of bulk materials in ambient and operando environments. We report high-resolution inelastic x-ray scattering experiments with high momentum and energy transfer performed at a storage-ring-based high-energy x-ray light source facility using an x-ray transition-edge sensor (TES) microcalorimeter detector. The performance was compared with a silicon drift detector (SDD), an energy-resolving semiconductor detector, and Compton profiles were measured for lithium and cobalt oxide powders relevant to lithium-ion battery research. Spectroscopic analysis of the measured Compton profiles demonstrates the high-sensitivity to the low-Z elements and oxidation states. The line shape analysis of the measured Compton profiles in comparison with computed Hartree-Fock profiles is usually limited by the resolution of the semiconductor detector. We have characterized an x-ray TES microcalorimeter detector for high-resolution Compton scattering experiments using a bending magnet source at the Advanced Photon Source with a double crystal monochromator, providing monochromatic photon energies near 27.5 keV. The momentum resolution below 0.16 atomic units (a.u.) was measured, yielding an improvement of more than a factor of 7 over a state-of-the-art SDD for the same scattering geometry. Furthermore, the lineshapes of narrow valence and broad core electron profiles of sealed lithium metal were clearly resolved using an x-ray TES compared to smeared and broadened lineshapes observed when using the SDD. High-resolution Compton scattering using the energy-resolving area detector shown here presents new opportunities for spatial imaging of electron momentum distributions for a wide class of materials with applications ranging from electrochemistry to condensed matter physics.

使用x射线微量热计的高分辨率康普顿光谱。
x射线康普顿能谱是为数不多的直接探测环境和操作环境中块状材料电子动量分布的方法之一。我们报道了在基于存储环的高能x射线光源设施上使用x射线过渡边缘传感器(TES)微热量计探测器进行的高动量和能量转移的高分辨率非弹性x射线散射实验。将其性能与硅漂移探测器(SDD)、能量分辨半导体探测器进行了比较,并测量了与锂离子电池研究相关的锂和钴氧化物粉末的康普顿谱。对测量的康普顿谱的光谱分析表明,该方法对低z元素和氧化态具有很高的灵敏度。测量的康普顿轮廓线与计算的哈特里-福克轮廓线的线形分析通常受到半导体探测器分辨率的限制。我们在先进光子源的双晶单色器上,利用弯曲磁源对高分辨率康普顿散射实验的x射线TES微热量计探测器进行了表征,提供了接近27.5 keV的单色光子能量。测量了低于0.16原子单位(a.u)的动量分辨率,在相同的散射几何形状下,比最先进的SDD提高了7倍以上。此外,与使用SDD观察到的涂污和变宽的线形相比,使用x射线TES可以清楚地分辨出密封锂金属的窄价和宽芯电子谱线形。使用能量分辨区域探测器的高分辨率康普顿散射为从电化学到凝聚态物理等广泛应用的材料的电子动量分布的空间成像提供了新的机会。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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