Research ethics: a profile of retractions from world class universities.

IF 4.3 3区材料科学 Q1 ENGINEERING, ELECTRICAL & ELECTRONIC

ACS Applied Electronic Materials Pub Date : 2021-01-01 Epub Date: 2021-05-23 DOI:10.1007/s11192-021-03987-y

Caroline Lievore, Priscila Rubbo, Celso Biynkievycz Dos Santos, Claudia Tânia Picinin, Luiz Alberto Pilatti

引用次数: 17

Abstract

This study aims to profile the scientific retractions published in journals indexed in the Web of Science database from 2010 to 2019, from researchers at the top 20 World Class Universities according to the Times Higher Education global ranking of 2020. Descriptive statistics, Pearson's correlation coefficient, and simple linear regression were used to analyze the data. Of the 330 analyzed retractions, Harvard University had the highest number of retractions and the main reason for retraction was data results. We conclude that the universities with a higher ranking tend to have a lower rate of retraction.

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研究伦理:世界一流大学撤回论文的概况。

本研究旨在分析2010年至2019年在Web of Science数据库索引期刊上发表的科学撤稿情况，这些撤稿来自《泰晤士报高等教育2020年全球排名》中排名前20位的世界一流大学的研究人员。采用描述性统计、Pearson相关系数和简单线性回归对数据进行分析。在分析的330篇论文撤稿中，哈佛大学的撤稿数量最多，撤稿的主要原因是数据结果。我们得出的结论是，排名越靠前的大学论文撤稿率越低。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

ACS Applied Electronic Materials Multiple-

CiteScore

7.20

自引率

4.30%

发文量

567

期刊介绍： ACS Applied Electronic Materials is an interdisciplinary journal publishing original research covering all aspects of electronic materials. The journal is devoted to reports of new and original experimental and theoretical research of an applied nature that integrate knowledge in the areas of materials science, engineering, optics, physics, and chemistry into important applications of electronic materials. Sample research topics that span the journal's scope are inorganic, organic, ionic and polymeric materials with properties that include conducting, semiconducting, superconducting, insulating, dielectric, magnetic, optoelectronic, piezoelectric, ferroelectric and thermoelectric. Indexed/Abstracted： Web of Science SCIE Scopus CAS INSPEC Portico