Modelling, Fabrication and Testing of RF Micro-Electro-Mechanical-Systems Switch

IF 1.8 Q3 MATERIALS SCIENCE, MULTIDISCIPLINARY
Srinivasa Rao Karumuri;P. Ashok Kumar;Girija Sravani Kondavitee;Aime Lay-Ekuakille
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Abstract

This paper presents an approach to evaluate capacitance developed by perforated membrane of RF MEMS switch with high accuracy. An analytical model is developed for both upstate and downstate of switch by including parasitic and fringing field capacitance in parallel plate capacitance model. The proposed analytical model includes the ligament efficiency term directly in the formula which reduce the efforts to calculate it individually for various perforation sizes. The capacitance analysis has been carried out by varying the physical parameters to optimize the switch dimensions and these analytical results are compared with the simulation results carried out by 3D FEM tool COMSOL multiphysics for validation. The proposed analytical model results are then compared with benchmark models to understand the efficiency of proposed model in estimating the up and downstate capacitances. The proposed analytical model proved to be good with less error percentage of 2.13% at upstate and 2.59% at downstate whereas the other benchmark models gives greater than 5% error. The switch is then fabricated using 4-mask surface micromachining process and experimental evaluation of capacitance at both upstate and downstate is carried out by DC probe station. Experimentally, the upstate capacitance is obtained as 37.4 fF and downstate as 2.43 pF and the analytical models exhibited low error percentage of 3.95% at upstate and 2.05% at downstate condition for µ = 0.5.
射频微机电系统开关的建模、制造和测试
本文提出了一种高精度评估射频MEMS开关穿孔膜电容的方法。在并联板电容模型中加入寄生场电容和边缘场电容,建立了开关上、下两种状态的解析模型。所提出的分析模型将韧带效率项直接包含在公式中,减少了对不同穿孔尺寸单独计算的工作量。通过改变物理参数来优化开关尺寸,进行了电容分析,并将分析结果与COMSOL multiphysics三维有限元工具的仿真结果进行了对比验证。然后将所提出的分析模型结果与基准模型进行比较,以了解所提出的模型在估计上下状态电容方面的效率。结果表明,该分析模型误差较小,上状态误差为2.13%,下状态误差为2.59%,而其他基准模型误差均大于5%。然后采用四掩模表面微加工工艺制作开关,并利用直流探头站对开关上、下状态电容进行了实验评估。实验结果表明,在μ = 0.5条件下,上态电容为37.4 fF,下态电容为2.43 pF,上态误差为3.95%,下态误差为2.05%。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
CiteScore
3.90
自引率
17.60%
发文量
10
审稿时长
12 weeks
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