Yang Wu, Chun-Hua Yang, He-Na Zhang, Liang-Hui Zhu, Xin-Yu Wang, Yun-Qing Li, Shi-Yu Zhu, Xiao-Chun Wang
{"title":"The flexible Janus X2PAs (X = Si, Ge and Sn) monolayers with in-plane and out-of-plane piezoelectricity","authors":"Yang Wu, Chun-Hua Yang, He-Na Zhang, Liang-Hui Zhu, Xin-Yu Wang, Yun-Qing Li, Shi-Yu Zhu, Xiao-Chun Wang","doi":"10.1016/j.apsusc.2022.152999","DOIUrl":null,"url":null,"abstract":"<div><p>The 2D piezoelectric materials have attracted growing attention due to their potential application in energy harvesters, strain sensors and active flexible electronics. Now, the challenge is to find flexible 2D material with piezoelectricity in both in-plane and out-of-plane. To address this challenge, this paper demonstrates the Janus X<sub>2</sub>PAs (X = Si, Ge and Sn) monolayers through density functional theory (DFT) calculation for the first time. The dynamical stability, stiffness and piezoelectric tensors of these monolayers are systematically investigated. The results show that these monolayers are stable and extremely flexible. The X<sub>2</sub>PAs monolayers exhibit piezoelectric effect in both in-plane and out-of-plane. Especially, among them, the Sn<sub>2</sub>PAs monolayer has the largest piezoelectric coefficient |<em>d<sub>31</sub></em>| (1.42 pm/V) that is two times larger than the |<em>d<sub>31</sub></em>| of group III–V buckled honeycomb (GaP, GaAs, InP and InAs) monolayers (0.40 ∼ 0.74 pm/V) and MoSO monolayer (0.7 pm/V). These facts are due to an inversion symmetry breaking (along the out-of-plane direction) in both atomic structures and charge distribution of X<sub>2</sub>PAs monolayers. The out-of-plane piezoelectric and flexible characters of these 2D Janus X<sub>2</sub>PAs monolayers could enhance their performance in multifunctional sensing and controlling of the nanodevices.</p></div>","PeriodicalId":247,"journal":{"name":"Applied Surface Science","volume":"589 ","pages":"Article 152999"},"PeriodicalIF":6.3000,"publicationDate":"2022-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"16","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Applied Surface Science","FirstCategoryId":"88","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0169433222005669","RegionNum":2,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"CHEMISTRY, PHYSICAL","Score":null,"Total":0}
引用次数: 16
Abstract
The 2D piezoelectric materials have attracted growing attention due to their potential application in energy harvesters, strain sensors and active flexible electronics. Now, the challenge is to find flexible 2D material with piezoelectricity in both in-plane and out-of-plane. To address this challenge, this paper demonstrates the Janus X2PAs (X = Si, Ge and Sn) monolayers through density functional theory (DFT) calculation for the first time. The dynamical stability, stiffness and piezoelectric tensors of these monolayers are systematically investigated. The results show that these monolayers are stable and extremely flexible. The X2PAs monolayers exhibit piezoelectric effect in both in-plane and out-of-plane. Especially, among them, the Sn2PAs monolayer has the largest piezoelectric coefficient |d31| (1.42 pm/V) that is two times larger than the |d31| of group III–V buckled honeycomb (GaP, GaAs, InP and InAs) monolayers (0.40 ∼ 0.74 pm/V) and MoSO monolayer (0.7 pm/V). These facts are due to an inversion symmetry breaking (along the out-of-plane direction) in both atomic structures and charge distribution of X2PAs monolayers. The out-of-plane piezoelectric and flexible characters of these 2D Janus X2PAs monolayers could enhance their performance in multifunctional sensing and controlling of the nanodevices.
期刊介绍:
Applied Surface Science covers topics contributing to a better understanding of surfaces, interfaces, nanostructures and their applications. The journal is concerned with scientific research on the atomic and molecular level of material properties determined with specific surface analytical techniques and/or computational methods, as well as the processing of such structures.