Applications of surface analytical techniques in Earth Sciences

IF 8.2 1区 化学 Q1 CHEMISTRY, PHYSICAL
Gujie Qian, Yubiao Li, Andrea R. Gerson
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引用次数: 37

Abstract

This review covers a wide range of surface analytical techniques: X-ray photoelectron spectroscopy (XPS), scanning photoelectron microscopy (SPEM), photoemission electron microscopy (PEEM), dynamic and static secondary ion mass spectroscopy (SIMS), electron backscatter diffraction (EBSD), atomic force microscopy (AFM). Others that are relatively less widely used but are also important to the Earth Sciences are also included: Auger electron spectroscopy (AES), low energy electron diffraction (LEED) and scanning tunnelling microscopy (STM). All these techniques probe only the very top sample surface layers (sub-nm to several tens of nm). In addition, we also present several other techniques i.e. Raman microspectroscopy, reflection infrared (IR) microspectroscopy and quantitative evaluation of minerals by scanning electron microscopy (QEMSCAN) that penetrate deeper into the sample, up to several μm, as all of them are fundamental analytical tools for the Earth Sciences. Grazing incidence synchrotron techniques, sensitive to surface measurements, are also briefly introduced at the end of this review. (Scanning) transmission electron microscopy (TEM/STEM) is a special case that can be applied to characterisation of mineralogical and geological sample surfaces. Since TEM/STEM is such an important technique for Earth Scientists, we have also included it to draw attention to the capability of TEM/STEM applied as a surface-equivalent tool.

While this review presents most of the important techniques for the Earth Sciences, it is not an all-inclusive bibliography of those analytical techniques. Instead, for each technique that is discussed, we first give a very brief introduction about its principle and background, followed by a short section on approaches to sample preparation that are important for researchers to appreciate prior to the actual sample analysis. We then use examples from publications (and also some of our known unpublished results) within the Earth Sciences to show how each technique is applied and used to obtain specific information and to resolve real problems, which forms the central theme of this review. Although this review focuses on applications of these techniques to study mineralogical and geological samples, we also anticipate that researchers from other research areas such as Material and Environmental Sciences may benefit from this review.

表面分析技术在地球科学中的应用
本文综述了广泛的表面分析技术:x射线光电子能谱(XPS)、扫描光电子显微镜(SPEM)、光电显微镜(PEEM)、动态和静态二次离子质谱(SIMS)、电子背散射衍射(EBSD)、原子力显微镜(AFM)。其他使用相对较少但对地球科学也很重要的方法还包括:俄歇电子能谱(AES)、低能电子衍射(LEED)和扫描隧道显微镜(STM)。所有这些技术都只探测样品的表层(亚纳米到几十纳米)。此外,我们还介绍了其他几种技术,即拉曼微光谱,反射红外(IR)微光谱和通过扫描电子显微镜(QEMSCAN)对矿物进行定量评估,这些技术可以深入到样品中,高达几μm,因为它们都是地球科学的基本分析工具。本文最后还简要介绍了对表面测量敏感的掠入射同步加速器技术。(扫描)透射电子显微镜(TEM/STEM)是一种特殊情况,可以应用于矿物学和地质样品表面的表征。由于TEM/STEM对地球科学家来说是一项如此重要的技术,我们也将其纳入其中,以引起人们对TEM/STEM作为地表等效工具应用的能力的关注。虽然这篇综述介绍了地球科学的大多数重要技术,但它并不是这些分析技术的全面参考书目。相反,对于所讨论的每一种技术,我们首先对其原理和背景进行非常简短的介绍,然后对样品制备方法进行简短的介绍,这对于研究人员在实际样品分析之前欣赏非常重要。然后,我们使用来自地球科学出版物的例子(以及一些已知的未发表的结果)来展示每种技术是如何应用和用于获取特定信息和解决实际问题的,这形成了本综述的中心主题。虽然这篇综述的重点是这些技术在研究矿物学和地质样品中的应用,但我们也希望材料和环境科学等其他研究领域的研究人员也能从这篇综述中受益。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
Surface Science Reports
Surface Science Reports 化学-物理:凝聚态物理
CiteScore
15.90
自引率
2.00%
发文量
9
审稿时长
178 days
期刊介绍: Surface Science Reports is a journal that specializes in invited review papers on experimental and theoretical studies in the physics, chemistry, and pioneering applications of surfaces, interfaces, and nanostructures. The topics covered in the journal aim to contribute to a better understanding of the fundamental phenomena that occur on surfaces and interfaces, as well as the application of this knowledge to the development of materials, processes, and devices. In this journal, the term "surfaces" encompasses all interfaces between solids, liquids, polymers, biomaterials, nanostructures, soft matter, gases, and vacuum. Additionally, the journal includes reviews of experimental techniques and methods used to characterize surfaces and surface processes, such as those based on the interactions of photons, electrons, and ions with surfaces.
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