Orienting and polishing single crystals for ultrasonic measurements.

Abstract

Some simple but adequate methods of orienting and polishing large single crystals for ultrasonic measurements are described. These methods are useful for a variety of materials, particularly for metals and ionic crystals. Included are an x-ray method of measuring orientation and a description of fixtures and procedures involved in polishing. The use of these techniques on low lineage crystals can result in orientation accuracies of less than ½°, flatness of 5 × 10−6 in, and parallelism of 2 seconds of arc with moderate means and effort.