Calibration of magnification, camera constant and image rotations for a Jem 7 electron microscope.

Abstract

The results of a detailed calibration of a Jem 7, high resolution, electron microscope operating at 100 kv are reported in this paper. Three types of measurements have been made: (i) magnification as a function of intermediate and objective lens currents; (ii) camera constant and its dependence on objective lens current; (iii) relative rotations between the object, image and diffraction pattern. These data are sufficiently complete to satisfy the requirements of detailed, analytical, diffraction contrast experiments.