Two-Dimensional Indium Selenide for Next-Generation Photodetection: Interface Engineering, Device Architectures, and Emerging Applications

IF 7.8 2区 材料科学 Q1 MATERIALS SCIENCE, MULTIDISCIPLINARY
Chao Du,Enshu Nan,Junyi Qian,Zhijie Zhang,Min Jin
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Abstract

Two-dimensional (2D) indium selenide (InSe) has emerged as a compelling semiconductor platform for next-generation photodetection because of its thickness-tunable bandgap, high carrier mobility, and strong light–matter interaction. Moreover, its nonlinear, ferroelectric, piezoelectric, and polarization‑related functionalities can be modulated by phase, layer number, stacking configuration, and device architecture. This Review summarizes the recent advances in InSe-based photodetectors through a structure–property–performance framework. We first discuss the crystal structures, thickness-dependent band evolution, and preparation strategies of InSe and then compare representative device architectures including single-InSe channels, van der Waals heterostructures, ferroelectric-gated devices, asymmetric Schottky contacts, optical microcavities, and plasmonic/metasurface contact designs. Particular attention is paid to contact engineering, interface regulation, dark-current suppression, carrier-extraction acceleration, and polarization-selective detection, which have become central routes for improving sensitivity, speed, stability, and multifunctionality. Recent applications in optical sensing, broadband and polarization-resolved imaging, flexible and wearable electronics, neuromorphic vision, and secure optical communication are further reviewed. Finally, the remaining challenges associated with wafer-scale growth, defect control, environmental stability, standardized benchmarking, complementary metal–oxide–semiconductor (CMOS)-compatible integration, and system-level deployment are critically discussed. By emphasizing both recent progress and unresolved bottlenecks, this Review aims to provide a clearer roadmap for developing practical, high-performance InSe-based optoelectronic technologies.

Abstract Image

用于下一代光探测的二维硒化铟:接口工程、器件架构和新兴应用
二维(2D)硒化铟(InSe)已成为下一代光探测的引人注目的半导体平台,因为它具有厚度可调的带隙,高载流子迁移率和强光物质相互作用。此外,它的非线性、铁电、压电和极化相关的功能可以通过相位、层数、堆叠配置和器件结构来调制。本文从结构-性能-性能的角度综述了近年来铟基光电探测器的研究进展。我们首先讨论了InSe的晶体结构、厚度相关的带演化和制备策略,然后比较了代表性的器件结构,包括单InSe通道、范德华异质结构、铁电门控器件、不对称肖特基接触、光学微腔和等离子体/超表面接触设计。特别关注接触工程、界面调节、暗电流抑制、载流子提取加速和极化选择性检测,这些已经成为提高灵敏度、速度、稳定性和多功能性的核心途径。综述了近年来在光学传感、宽带和偏振分辨成像、柔性和可穿戴电子、神经形态视觉和安全光通信等领域的应用。最后,对晶圆级生长、缺陷控制、环境稳定性、标准化基准测试、互补金属氧化物半导体(CMOS)兼容集成和系统级部署相关的剩余挑战进行了批判性讨论。通过强调最近的进展和尚未解决的瓶颈,本综述旨在为开发实用、高性能的基于inse的光电技术提供更清晰的路线图。
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来源期刊
ACS Applied Materials & Interfaces
ACS Applied Materials & Interfaces 工程技术-材料科学:综合
CiteScore
16.00
自引率
6.30%
发文量
4978
审稿时长
1.8 months
期刊介绍: ACS Applied Materials & Interfaces is a leading interdisciplinary journal that brings together chemists, engineers, physicists, and biologists to explore the development and utilization of newly-discovered materials and interfacial processes for specific applications. Our journal has experienced remarkable growth since its establishment in 2009, both in terms of the number of articles published and the impact of the research showcased. We are proud to foster a truly global community, with the majority of published articles originating from outside the United States, reflecting the rapid growth of applied research worldwide.
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