Magnetoelectric Multiferroics for the Next-Generation Ultralow-Power Electronics.

IF 14.1 1区 材料科学 Q1 CHEMISTRY, MULTIDISCIPLINARY
Yang Liu, Yunlong Sun, Hao Luo, Duoduo Zhao, Yuhan Zeng, Xuzihan Zhang, Zhewei Liu, Hao Peng, Zhijing Zhang, Jack Yang, Ji Zhang, Danyang Wang, Junjie Shi, Sean Li
{"title":"Magnetoelectric Multiferroics for the Next-Generation Ultralow-Power Electronics.","authors":"Yang Liu, Yunlong Sun, Hao Luo, Duoduo Zhao, Yuhan Zeng, Xuzihan Zhang, Zhewei Liu, Hao Peng, Zhijing Zhang, Jack Yang, Ji Zhang, Danyang Wang, Junjie Shi, Sean Li","doi":"10.1002/advs.78344","DOIUrl":null,"url":null,"abstract":"<p><p>Magnetoelectric multiferroics enable voltage control of magnetic states for low-energy, non-volatile memory and logic. Their practical value, however, depends on the complete device pathway, not coupling strength alone. This Review evaluates materials, switching mechanisms, and devices against these requirements, distinguishing measured performance from projected targets. We compare three magnetoelectric random-access memory (MeRAM) routes with ferroelectric RAM and spin-transfer torque magnetic RAM, and assess magnetoelectric spin-orbit (MESO) logic alongside complementary metal-oxide-semiconductor (CMOS) technology and current-driven spintronics. MeRAM combines electric-field writing, magnetic storage, and nondestructive readout, with prospects for low write energy and closer memory-logic integration. However, no integrated device has yet combined these benefits with competitive speed, retention, endurance, read margin, and density. For magnetoelectric logic, projected low-voltage, non-volatile operation has yet to be matched by experimental demonstrations of the full conversion path, gain and fan-out. Results from BiFeO<sub>3</sub>, room-temperature hexaferrites and other platforms identify deterministic switching, interface quality and thin-film integration as central to closing the gap between projections and experiments. Magnetoelectric devices are therefore more likely to complement CMOS than replace it, particularly in logic-in-memory, compute-near-memory and normally-off systems, where non-volatility and reduced data movement could support next-generation ultralow-power electronics.</p>","PeriodicalId":117,"journal":{"name":"Advanced Science","volume":" ","pages":"e78344"},"PeriodicalIF":14.1000,"publicationDate":"2026-10-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC13676993/pdf/","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Advanced Science","FirstCategoryId":"88","ListUrlMain":"https://doi.org/10.1002/advs.78344","RegionNum":1,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"CHEMISTRY, MULTIDISCIPLINARY","Score":null,"Total":0}
引用次数: 0

Abstract

Magnetoelectric multiferroics enable voltage control of magnetic states for low-energy, non-volatile memory and logic. Their practical value, however, depends on the complete device pathway, not coupling strength alone. This Review evaluates materials, switching mechanisms, and devices against these requirements, distinguishing measured performance from projected targets. We compare three magnetoelectric random-access memory (MeRAM) routes with ferroelectric RAM and spin-transfer torque magnetic RAM, and assess magnetoelectric spin-orbit (MESO) logic alongside complementary metal-oxide-semiconductor (CMOS) technology and current-driven spintronics. MeRAM combines electric-field writing, magnetic storage, and nondestructive readout, with prospects for low write energy and closer memory-logic integration. However, no integrated device has yet combined these benefits with competitive speed, retention, endurance, read margin, and density. For magnetoelectric logic, projected low-voltage, non-volatile operation has yet to be matched by experimental demonstrations of the full conversion path, gain and fan-out. Results from BiFeO3, room-temperature hexaferrites and other platforms identify deterministic switching, interface quality and thin-film integration as central to closing the gap between projections and experiments. Magnetoelectric devices are therefore more likely to complement CMOS than replace it, particularly in logic-in-memory, compute-near-memory and normally-off systems, where non-volatility and reduced data movement could support next-generation ultralow-power electronics.

用于下一代超低功率电子器件的磁电多铁体。
磁电多铁体可以对低能量、非易失性存储器和逻辑的磁态进行电压控制。然而,它们的实用价值取决于完整的器件通路,而不仅仅是耦合强度。本综述根据这些要求评估材料、开关机制和器件,将测量性能与预期目标区分开来。我们比较了三种磁电随机存取存储器(MeRAM)路线与铁电RAM和自旋传递扭矩磁RAM,并评估了磁电自旋轨道(MESO)逻辑与互补金属氧化物半导体(CMOS)技术和电流驱动自旋电子学。MeRAM结合了电场写入、磁存储和无损读出,具有低写入能量和更紧密的存储逻辑集成的前景。然而,目前还没有集成设备将这些优势与具有竞争力的速度、保留、耐用性、读取余量和密度结合起来。对于磁电逻辑,预计的低压,非易失性操作尚未与完整转换路径,增益和扇出的实验演示相匹配。来自BiFeO3、室温六铁氧体和其他平台的研究结果表明,确定性开关、界面质量和薄膜集成是缩小预测和实验之间差距的核心。因此,磁电器件更有可能补充而不是取代CMOS,特别是在逻辑内存、计算近内存和正常关闭系统中,在这些系统中,非易失性和减少数据移动可以支持下一代超低功耗电子产品。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
Advanced Science
Advanced Science CHEMISTRY, MULTIDISCIPLINARYNANOSCIENCE &-NANOSCIENCE & NANOTECHNOLOGY
CiteScore
18.90
自引率
2.60%
发文量
1602
审稿时长
1.9 months
期刊介绍: Advanced Science is a prestigious open access journal that focuses on interdisciplinary research in materials science, physics, chemistry, medical and life sciences, and engineering. The journal aims to promote cutting-edge research by employing a rigorous and impartial review process. It is committed to presenting research articles with the highest quality production standards, ensuring maximum accessibility of top scientific findings. With its vibrant and innovative publication platform, Advanced Science seeks to revolutionize the dissemination and organization of scientific knowledge.
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信
小红书