Junjiang Zhou, Hua Wei, Jiayun Deng, Hanbao Liu, Jie Yang, Chong Wang, Feng Qiu, Feng Hui, Xueqin Pang, Bin Yang
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引用次数: 0
Abstract
Sulfur-doped indium phosphide (InP) is an important III–V compound semiconductor used in high-speed optoelectronic and photonic devices. Its brittle and anisotropic response makes it susceptible to orientation-dependent deformation, cracking and subsurface damage during precision machining. Molecular dynamics simulations, nanoindentation experiments, focused ion beam (FIB) cross-sectioning and cross-sectional transmission electron microscopy (XTEM) were combined to investigate indentation-induced deformation and damage in sulfur-doped InP wafers with (100), (110) and (111) orientations. Crystallographic orientation strongly affected plasticity initiation, defect evolution and crack propagation. The (100) plane showed early plastic activation, extensive multi-slip activity, dense interconnected dislocation networks and the greatest measured longitudinal crack penetration of 19.50 μm. The (110) plane exhibited more localised deformation and the shallowest penetration depth of 14.03 μm, although interacting transverse cracks produced pronounced surface spalling. The (111) plane showed delayed defect nucleation, the highest hardness and the greatest elastic recovery (24.82%), but developed long radial cracks and a penetration depth of 15.27 μm, together with deeper defect propagation and localised lattice rotation. HRTEM and diffraction analyses further revealed orientation-dependent lattice distortion and localised structural disorder near cracks. When considered together with the pop-in response, dislocation structures, strain localisation and crack morphology, maximum resolved shear stress analysis provided a qualitative crystallographic interpretation of the measured damage-depth ranking of (100) > (111) > (110). These findings show that each orientation has a distinct combination of surface and subsurface damage and provide a mechanistic basis for orientation-aware damage control during precision machining.
期刊介绍:
Materials Characterization features original articles and state-of-the-art reviews on theoretical and practical aspects of the structure and behaviour of materials.
The Journal focuses on all characterization techniques, including all forms of microscopy (light, electron, acoustic, etc.,) and analysis (especially microanalysis and surface analytical techniques). Developments in both this wide range of techniques and their application to the quantification of the microstructure of materials are essential facets of the Journal.
The Journal provides the Materials Scientist/Engineer with up-to-date information on many types of materials with an underlying theme of explaining the behavior of materials using novel approaches. Materials covered by the journal include:
Metals & Alloys
Ceramics
Nanomaterials
Biomedical materials
Optical materials
Composites
Natural Materials.