{"title":"Stabilization of Ferroelectric Polarization of Ultrathin Films by Surface Modification with Ion Beams","authors":"D. V. Kuzenko","doi":"10.1134/S1027451026701053","DOIUrl":null,"url":null,"abstract":"<p>The stabilization of spontaneous polarization in ultrathin ferroelectric films was studied. For this purpose, surface modification by implantation of metal ions with energies of 10<sup>2</sup>–10<sup>3</sup> eV was proposed. Based on Lindhard–Scharff–Schiøtt (LSS) theory, this approach made it possible to consider the electronic energy-loss mechanism during interaction and excitation of the electronic subsystems of the interacting ions. The Thomas–Fermi screening length λ<sub>F–D</sub> and Debye screening length λ<sub>D</sub> were calculated to determine the conditions for screening the electric charge of free electrons. The importance of accounting for the temperature dependence of the dielectric permittivity ε(<i>T</i>) of the ferroelectric target when selecting the temperature conditions for surface modification by ion beams was demonstrated. This dependence is associated with activation processes of the ferroelectric phase transition having different activation energies, including activation and interaction of the defect, domain, and electronic structures of the ferroelectric. To select the metal ion for implantation, the interaction potential <i>U</i> between the implanted metal ions and the ions of the cubic perovskite crystal structure was calculated using the Thomas–Fermi model with an exponential function describing electron screening of the nuclei. SrTiO<sub>3</sub>, BaTiO<sub>3</sub>, PbTiO<sub>3</sub>, and the Pb(Zr,Ti)O<sub>3</sub> solid solution were used as model samples.</p>","PeriodicalId":671,"journal":{"name":"Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques","volume":"20 3","pages":"551 - 557"},"PeriodicalIF":0.4000,"publicationDate":"2026-10-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques","FirstCategoryId":"1085","ListUrlMain":"https://link.springer.com/article/10.1134/S1027451026701053","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"PHYSICS, CONDENSED MATTER","Score":null,"Total":0}
引用次数: 0
Abstract
The stabilization of spontaneous polarization in ultrathin ferroelectric films was studied. For this purpose, surface modification by implantation of metal ions with energies of 102–103 eV was proposed. Based on Lindhard–Scharff–Schiøtt (LSS) theory, this approach made it possible to consider the electronic energy-loss mechanism during interaction and excitation of the electronic subsystems of the interacting ions. The Thomas–Fermi screening length λF–D and Debye screening length λD were calculated to determine the conditions for screening the electric charge of free electrons. The importance of accounting for the temperature dependence of the dielectric permittivity ε(T) of the ferroelectric target when selecting the temperature conditions for surface modification by ion beams was demonstrated. This dependence is associated with activation processes of the ferroelectric phase transition having different activation energies, including activation and interaction of the defect, domain, and electronic structures of the ferroelectric. To select the metal ion for implantation, the interaction potential U between the implanted metal ions and the ions of the cubic perovskite crystal structure was calculated using the Thomas–Fermi model with an exponential function describing electron screening of the nuclei. SrTiO3, BaTiO3, PbTiO3, and the Pb(Zr,Ti)O3 solid solution were used as model samples.
期刊介绍:
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques publishes original articles on the topical problems of solid-state physics, materials science, experimental techniques, condensed media, nanostructures, surfaces of thin films, and phase boundaries: geometric and energetical structures of surfaces, the methods of computer simulations; physical and chemical properties and their changes upon radiation and other treatments; the methods of studies of films and surface layers of crystals (XRD, XPS, synchrotron radiation, neutron and electron diffraction, electron microscopic, scanning tunneling microscopic, atomic force microscopic studies, and other methods that provide data on the surfaces and thin films). Articles related to the methods and technics of structure studies are the focus of the journal. The journal accepts manuscripts of regular articles and reviews in English or Russian language from authors of all countries. All manuscripts are peer-reviewed.