Bolin Li, Chenglong Lian, Mengrui Li, Xiaojun Sun, Mingxu Wang, Li Wang, Guibing Shi
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引用次数: 0
Abstract
Though Finemet SMCs exhibit excellent high-frequency soft-magnetic performance, their core losses (Pcv) at high frequencies remain to be further reduced. In this work, the effects of HNO3, H3PO4, and H2C2O4 passivation on the Finemet nanocrystalline powders were systematically investigated to decrease the Pcv at ~ 1000 kHz. The results show that Pcv exhibits a valley-shaped variation with increasing acid concentration for all three kinds of acids, while the permeability (μe) declines gradually. Among the passivated samples, the SMCs passivated with HNO3 deliver superior comprehensive soft-magnetic properties, achieving a 36% reduction in Pcv at 1000 kHz (Bm = 20 mT) compared with the untreated sample. Loss separation analysis further reveals that acid passivation mainly reduces the core loss by suppressing eddy current loss (Pe). Compared with H3PO4 and H2C2O4, the strong oxidizing property of nitric acid accelerates the rapid formation of denser and more continuous insulating oxide films on powder surfaces, which effectively breaks intergranular conductive paths and remarkably reduces Pe dominating high-frequency Pcv. Meanwhile, the passivation layer derived from HNO3 contains Fe3O4, whose partial ferromagnetic contribution is beneficial to alleviate magnetic dilution. As a result, the SMCs after proper HNO3 passivation maintain a high μe, while achieve favorable electrical insulation.
期刊介绍:
The Journal of Materials Science: Materials in Electronics is an established refereed companion to the Journal of Materials Science. It publishes papers on materials and their applications in modern electronics, covering the ground between fundamental science, such as semiconductor physics, and work concerned specifically with applications. It explores the growth and preparation of new materials, as well as their processing, fabrication, bonding and encapsulation, together with the reliability, failure analysis, quality assurance and characterization related to the whole range of applications in electronics. The Journal presents papers in newly developing fields such as low dimensional structures and devices, optoelectronics including III-V compounds, glasses and linear/non-linear crystal materials and lasers, high Tc superconductors, conducting polymers, thick film materials and new contact technologies, as well as the established electronics device and circuit materials.