{"title":"Wetting of Surface and Grain Boundaries in Tungsten with Melted Nickel","authors":"B. B. Straumal, V. M. Kiiko, V. G. Sursaeva","doi":"10.1134/S1027451026701156","DOIUrl":null,"url":null,"abstract":"<p>The paper describes the wetting of polycrystalline and bicrystalline tungsten samples. A process flow chart is described for wetting solid tungsten with molten nickel in a vacuum at temperatures between 1550 and 1800°C. The structure of the samples was studied using scanning electron microscopes equipped with energy-dispersive spectrometers, which allowed the identification of chemical elements. The formation of chemical compounds Ni<sub>4</sub>W and NiW<sub>2</sub> and nickel-tungsten solid solutions in regions along the initial nickel-tungsten interfaces was established. Decreasing values of the contact angles of wetting tungsten with nickel from ~15° to 4° with increasing temperature in the specified temperature range were observed. Penetration of molten nickel was detected along the interface between single crystals in the tungsten bicrystal, the content of which decreased from the surface of the sample in a quadratic dependence. The nature of the interaction of polycrystalline and bicrystal tungsten with molten nickel is practically identical. The obtained results can be used in the development of composite materials and alloys, including pseudoalloys, in determining the area of their use, as well as in optimizing the processes of soldering and obtaining nickel-containing coatings on refractory metals.</p>","PeriodicalId":671,"journal":{"name":"Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques","volume":"20 3","pages":"618 - 623"},"PeriodicalIF":0.4000,"publicationDate":"2026-10-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques","FirstCategoryId":"1085","ListUrlMain":"https://link.springer.com/article/10.1134/S1027451026701156","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"PHYSICS, CONDENSED MATTER","Score":null,"Total":0}
引用次数: 0
Abstract
The paper describes the wetting of polycrystalline and bicrystalline tungsten samples. A process flow chart is described for wetting solid tungsten with molten nickel in a vacuum at temperatures between 1550 and 1800°C. The structure of the samples was studied using scanning electron microscopes equipped with energy-dispersive spectrometers, which allowed the identification of chemical elements. The formation of chemical compounds Ni4W and NiW2 and nickel-tungsten solid solutions in regions along the initial nickel-tungsten interfaces was established. Decreasing values of the contact angles of wetting tungsten with nickel from ~15° to 4° with increasing temperature in the specified temperature range were observed. Penetration of molten nickel was detected along the interface between single crystals in the tungsten bicrystal, the content of which decreased from the surface of the sample in a quadratic dependence. The nature of the interaction of polycrystalline and bicrystal tungsten with molten nickel is practically identical. The obtained results can be used in the development of composite materials and alloys, including pseudoalloys, in determining the area of their use, as well as in optimizing the processes of soldering and obtaining nickel-containing coatings on refractory metals.
期刊介绍:
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques publishes original articles on the topical problems of solid-state physics, materials science, experimental techniques, condensed media, nanostructures, surfaces of thin films, and phase boundaries: geometric and energetical structures of surfaces, the methods of computer simulations; physical and chemical properties and their changes upon radiation and other treatments; the methods of studies of films and surface layers of crystals (XRD, XPS, synchrotron radiation, neutron and electron diffraction, electron microscopic, scanning tunneling microscopic, atomic force microscopic studies, and other methods that provide data on the surfaces and thin films). Articles related to the methods and technics of structure studies are the focus of the journal. The journal accepts manuscripts of regular articles and reviews in English or Russian language from authors of all countries. All manuscripts are peer-reviewed.