Microstructure of Thin-Film Cr‒Mn‒A (A = W, Pt, Cu) Systems and Magnetic Properties of Layered Composites Based on Them

IF 0.4 Q4 PHYSICS, CONDENSED MATTER

Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques Pub Date : 2026-10-17 DOI:10.1134/S102745102670117X

A. A. Yushkov, A. A. Feshchenko, V. N. Lepalovskij, S. V. Semenova, A. S. Kalashnikova, V. O. Vas’kovsky

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Abstract

Films of the antiferromagnet Cr₇₀Mn₃₀ doped with W, Pt, and Cu in amounts of up to 30 at % were obtained by magnetron cosputtering of targets. The microstructure of the films was studied using transmission electron microscopy. General and specific patterns of structure modification with different doping levels were revealed, which are associated with the intensification of diffusion processes at the film growth stage under the action of dopants. Changes in the size and morphology of crystals growing in the films were observed. In the case of doping with tungsten, superstructural ordering of the crystal lattice was observed. Ferromagnet/antiferromagnet composites based on these films were also obtained to study their magnetic properties. The coercive force and exchange bias field were measured depending on the dopant concentration. A correlation between the structural features of the doped antiferromagnet and the hysteresis properties of the composites based on it was established.

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Cr-Mn-A （A = W, Pt, Cu）薄膜体系的微观结构及其层状复合材料的磁性能

用磁控溅射法制备了W、Pt和Cu掺杂量高达30% at %的反铁磁体Cr70Mn30薄膜。利用透射电镜对膜的微观结构进行了研究。揭示了不同掺杂水平下结构修饰的一般和特定模式，这与掺杂作用下薄膜生长阶段扩散过程的增强有关。观察到薄膜中生长的晶体的大小和形态的变化。在掺杂钨的情况下，观察到晶格的上层结构有序。在此基础上制备了铁磁体/反铁磁体复合材料，并对其磁性能进行了研究。测量了不同掺杂浓度下的矫顽力和交换偏置场。在此基础上建立了掺杂反铁磁体的结构特征与复合材料磁滞特性之间的关系。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques PHYSICS, CONDENSED MATTER-

CiteScore

0.90

自引率

25.00%

发文量

144

审稿时长

3-8 weeks

期刊介绍： Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques publishes original articles on the topical problems of solid-state physics, materials science, experimental techniques, condensed media, nanostructures, surfaces of thin films, and phase boundaries: geometric and energetical structures of surfaces, the methods of computer simulations; physical and chemical properties and their changes upon radiation and other treatments; the methods of studies of films and surface layers of crystals (XRD, XPS, synchrotron radiation, neutron and electron diffraction, electron microscopic, scanning tunneling microscopic, atomic force microscopic studies, and other methods that provide data on the surfaces and thin films). Articles related to the methods and technics of structure studies are the focus of the journal. The journal accepts manuscripts of regular articles and reviews in English or Russian language from authors of all countries. All manuscripts are peer-reviewed.