Mechanism of Perfluoropolyether Lubricant Decomposition and SiOx Smear Growth in Heat-Assisted Magnetic Recording

IF 3.5 3区 工程技术 Q2 ENGINEERING, CHEMICAL
Hiroshi Tani, Renguo Lu, Shinji Koganezawa
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Abstract

Perfluoropolyether (PFPE) lubricants in heat-assisted magnetic recording (HAMR) hard disk drives are exposed to extreme thermal conditions at the head–disk interface, where local surface temperatures reach 300–400 °C. Under these conditions, PFPE decomposition is promoted, potentially generating HF-related fluoride species that may affect silicon oxide (SiOx) smear growth on the near-field transducer surface. This study investigates PFPE decomposition and SiOx smear growth through four experiments. Accelerated-aging tests in sealed glass ampoules demonstrate that hydroxyl-terminated PFPE lubricants decompose under high temperature and elevated pressure, with glass corrosion products detected by time-of-flight secondary ion-mass spectrometry (TOF–SIMS) providing strong indirect evidence for HF-related fluoride species generation. Moisture accelerates decomposition. TOF–SIMS analysis of commercial HAMR smear suggests that surface silanol groups may serve as SiOx precursors and reveals an inverse relationship between HF- and SiO2-related ion intensities. Temperature-dependent analysis is consistent with thermally activated Si migration from the magnetic layer and silanol decomposition above 300 °C. Laser-heating experiments with lubricant film thicknesses of 7, 10, and 15 Å show that increasing film thickness is associated with increased HF-related fluoride species generation and decreased SiOx accumulation. A three-step tribochemical mechanism is proposed: Si species react with adsorbed water to form silanol groups; these groups decompose under laser heating, potentially generating volatile silicon monoxide; and silicon monoxide may transform into SiOx, potentially inhibited by HF-related fluoride species. These findings highlight the importance of lubricant film thickness and moisture control in balancing SiOx smear formation and HF-related corrosion at the HAMR head–disk interface.

Graphical Abstract

热辅助磁记录中全氟聚醚润滑剂分解和SiOx涂片生长机理
热辅助磁记录(HAMR)硬盘驱动器中的全氟聚醚(PFPE)润滑剂暴露在磁头磁盘接口处的极端热条件下,其局部表面温度达到300-400°C。在这些条件下,PFPE分解被促进,可能产生hf相关的氟化物,可能影响近场换能器表面氧化硅(SiOx)涂抹生长。本研究通过四个实验研究PFPE分解和SiOx涂片生长。密封玻璃安瓿中的加速老化试验表明,端羟基PFPE润滑油在高温高压下会分解,通过飞行时间二次离子质谱(TOF-SIMS)检测到的玻璃腐蚀产物为hf相关氟化物的产生提供了强有力的间接证据。水分加速分解。商用HAMR涂片的TOF-SIMS分析表明,表面硅烷醇基团可能作为SiOx前体,并揭示了HF-和sio2相关离子强度之间的反比关系。温度相关的分析结果与300°C以上磁层的热活化硅迁移和硅醇分解一致。当润滑膜厚度分别为7、10和15 Å时,激光加热实验表明,润滑膜厚度的增加增加了hf相关氟化物的生成,减少了SiOx的积累。提出了一个三步摩擦化学机理:硅与吸附水反应生成硅醇基团;这些基团在激光加热下分解,可能产生挥发性的一氧化硅;而一氧化硅可能转化为SiOx,可能受到hf相关氟化物的抑制。这些发现强调了润滑膜厚度和水分控制在平衡HAMR头盘界面SiOx涂抹形成和hf相关腐蚀方面的重要性。图形抽象
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来源期刊
Tribology Letters
Tribology Letters 工程技术-工程:化工
CiteScore
5.30
自引率
9.40%
发文量
116
审稿时长
2.5 months
期刊介绍: Tribology Letters is devoted to the development of the science of tribology and its applications, particularly focusing on publishing high-quality papers at the forefront of tribological science and that address the fundamentals of friction, lubrication, wear, or adhesion. The journal facilitates communication and exchange of seminal ideas among thousands of practitioners who are engaged worldwide in the pursuit of tribology-based science and technology.
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