S. Udhayan, G. Sudha, A. M. S. Arulanantham, P. Mohanraj, K. Dinesh Babu, N. Muthurathinam, C. Rangasami, F. Regan Maria Sundar Raj
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引用次数: 0
Abstract
Nonlinear optical properties are of increasing importance in the development of optoelectronic devices. In the current study, undoped and gadolinium-doped In2S3 thin films have been deposited by nebulizer spray pyrolysis within a Gd doping range of 0–5 wt%. The focus of the investigation is on how the presence of rare-earth element affects the optical properties gadolinium has been chosen to be used as the dopant since the ionic radius of gadolinium is nearly equal to that of In3+, which would make it possible for gadolinium to occupy the same position as the In3+ ion without causing crystal structure distortion. Different analytical methods have been employed to investigate the physical properties of the prepared samples. It is noteworthy that the 3 wt% Gd sample exhibits the strongest overall nonlinear optical response among the studied samples, with the nonlinear absorption coefficient, nonlinear refractive index, and third-order susceptibility all peaking at this composition, alongside a direct bandgap of 2.49 eV identifying it as a promising candidate absorber layer, while the smallest crystallite size among the crystalline samples was instead observed at 4 wt% Gd (see Tables 1 and 3). The surface of the films had a tight nano-grain structure, forming dots throughout the film. Visible-to-NIR absorbance spectra (400–1000 nm) showed a progressive increase in absorbance with Gd doping up to 3 wt%, followed by a decrease at higher concentrations. The optical bandgap decreased from 2.76 eV (undoped) to a minimum of 2.49 eV at 3 wt% Gd, before increasing again at higher doping levels. Values ranging from 2.49 to 2.76 eV were obtained using the Tauc equation. Z-scan method was used to evaluate the values of nonlinear absorption coefficient, nonlinear refractive index, and third-order susceptibility in both undoped and doped thin films. The nonlinear absorption coefficient β, nonlinear refractive index n2, and third-order susceptibility |χ(3)| all peaked at 3 wt% Gd, with β ranging from −3.98 × 10⁻2 m/W (undoped) to −7.40 × 10⁻2 m/W, n2 ranging from −4.41 × 10⁻9 to −12.09 × 10⁻9 m2/W, and |χ(3)| ranging from 491.4 × 10⁻13 to 2149.5 × 10⁻13 m2/V2. Results have shown that NLO properties make these thin films good candidates for optical switches and sensors.
期刊介绍:
The Journal of Materials Science: Materials in Electronics is an established refereed companion to the Journal of Materials Science. It publishes papers on materials and their applications in modern electronics, covering the ground between fundamental science, such as semiconductor physics, and work concerned specifically with applications. It explores the growth and preparation of new materials, as well as their processing, fabrication, bonding and encapsulation, together with the reliability, failure analysis, quality assurance and characterization related to the whole range of applications in electronics. The Journal presents papers in newly developing fields such as low dimensional structures and devices, optoelectronics including III-V compounds, glasses and linear/non-linear crystal materials and lasers, high Tc superconductors, conducting polymers, thick film materials and new contact technologies, as well as the established electronics device and circuit materials.