Optical nonlinear properties of gadolinium-doped In2S3 thin films prepared by nebulizer-aided spray pyrolysis method

IF 3.2 4区 工程技术 Q2 ENGINEERING, ELECTRICAL & ELECTRONIC
S. Udhayan, G. Sudha, A. M. S. Arulanantham, P. Mohanraj, K. Dinesh Babu, N. Muthurathinam, C. Rangasami, F. Regan Maria Sundar Raj
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Abstract

Nonlinear optical properties are of increasing importance in the development of optoelectronic devices. In the current study, undoped and gadolinium-doped In2S3 thin films have been deposited by nebulizer spray pyrolysis within a Gd doping range of 0–5 wt%. The focus of the investigation is on how the presence of rare-earth element affects the optical properties gadolinium has been chosen to be used as the dopant since the ionic radius of gadolinium is nearly equal to that of In3+, which would make it possible for gadolinium to occupy the same position as the In3+ ion without causing crystal structure distortion. Different analytical methods have been employed to investigate the physical properties of the prepared samples. It is noteworthy that the 3 wt% Gd sample exhibits the strongest overall nonlinear optical response among the studied samples, with the nonlinear absorption coefficient, nonlinear refractive index, and third-order susceptibility all peaking at this composition, alongside a direct bandgap of 2.49 eV identifying it as a promising candidate absorber layer, while the smallest crystallite size among the crystalline samples was instead observed at 4 wt% Gd (see Tables 1 and 3). The surface of the films had a tight nano-grain structure, forming dots throughout the film. Visible-to-NIR absorbance spectra (400–1000 nm) showed a progressive increase in absorbance with Gd doping up to 3 wt%, followed by a decrease at higher concentrations. The optical bandgap decreased from 2.76 eV (undoped) to a minimum of 2.49 eV at 3 wt% Gd, before increasing again at higher doping levels. Values ranging from 2.49 to 2.76 eV were obtained using the Tauc equation. Z-scan method was used to evaluate the values of nonlinear absorption coefficient, nonlinear refractive index, and third-order susceptibility in both undoped and doped thin films. The nonlinear absorption coefficient β, nonlinear refractive index n2, and third-order susceptibility |χ(3)| all peaked at 3 wt% Gd, with β ranging from −3.98 × 10⁻2 m/W (undoped) to −7.40 × 10⁻2 m/W, n2 ranging from −4.41 × 10⁻9 to −12.09 × 10⁻9 m2/W, and |χ(3)| ranging from 491.4 × 10⁻13 to 2149.5 × 10⁻13 m2/V2. Results have shown that NLO properties make these thin films good candidates for optical switches and sensors.

雾化器辅助喷雾热解法制备掺钆In2S3薄膜的光学非线性性质
非线性光学特性在光电器件的发展中具有越来越重要的意义。在本研究中,在Gd掺杂0-5 wt%的范围内,通过雾化器喷雾热解沉积了未掺杂和掺杂钆的In2S3薄膜。研究的重点是稀土元素的存在对光学性质的影响,选择钆作为掺杂剂,因为钆的离子半径与In3+的离子半径几乎相等,这样可以使钆占据与In3+离子相同的位置而不会引起晶体结构畸变。采用不同的分析方法对所制备样品的物理性质进行了研究。值得注意的是,在所研究的样品中,3 wt% Gd的样品表现出最强的整体非线性光学响应,非线性吸收系数、非线性折射率和三阶磁化率都在该成分处达到峰值,同时直接带隙为2.49 eV,这表明它是一个有希望的候选吸收层,而在晶体样品中,最小的晶体尺寸是在4 wt% Gd处观察到的(见表1和3)。薄膜表面具有紧密的纳米颗粒结构,在整个薄膜中形成点。可见光到近红外光谱(400-1000 nm)显示,Gd掺杂后吸光度逐渐增加,达到3wt %,随后在较高浓度下吸光度下降。光学带隙从2.76 eV(未掺杂)下降到最小的2.49 eV (Gd为3 wt%),然后在更高掺杂水平下再次增加。利用Tauc方程得到了2.49 ~ 2.76 eV的值。采用z扫描法对未掺杂和掺杂薄膜的非线性吸收系数、非线性折射率和三阶磁化率进行了测定。非线性吸收系数β,非线性折射系数n2和三阶灵敏度|χ(3)|都达到了3wt % Gd的峰值,β的范围从- 3.98 × 10⁻m/W(未开发)到- 7.40 × 10⁻m/W, n2的范围从- 4.41 × 10毒血症至- 12.09 × 10毒血症m2/W, |χ(3)|的范围从491.4 × 10毒血症至2149.5 × 10毒血症m2/V2。结果表明,NLO特性使这些薄膜成为光学开关和传感器的良好候选者。
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来源期刊
Journal of Materials Science: Materials in Electronics
Journal of Materials Science: Materials in Electronics 工程技术-材料科学:综合
CiteScore
5.00
自引率
7.10%
发文量
1931
审稿时长
2 months
期刊介绍: The Journal of Materials Science: Materials in Electronics is an established refereed companion to the Journal of Materials Science. It publishes papers on materials and their applications in modern electronics, covering the ground between fundamental science, such as semiconductor physics, and work concerned specifically with applications. It explores the growth and preparation of new materials, as well as their processing, fabrication, bonding and encapsulation, together with the reliability, failure analysis, quality assurance and characterization related to the whole range of applications in electronics. The Journal presents papers in newly developing fields such as low dimensional structures and devices, optoelectronics including III-V compounds, glasses and linear/non-linear crystal materials and lasers, high Tc superconductors, conducting polymers, thick film materials and new contact technologies, as well as the established electronics device and circuit materials.
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