Performance Evolution of XLPE–EPDM Interface Insulation Under Repetitive Impulse Discharges

IF 3.3 3区 工程技术 Q2 ENGINEERING, ELECTRICAL & ELECTRONIC
Zhaogui Liu;Ying Liu;Gang Zeng;Xiaomei Liu;Jiaxiang He
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引用次数: 0

Abstract

Emerging power-electronic-based systems expose high-voltage (HV) equipment to frequent impulse stresses, posing challenges to the reliability of solid–solid insulation interfaces in components such as cable accessories. Although the breakdown characteristics of the interfaces have been widely studied, long-term degradation under such conditions remains insufficiently understood. This work investigates the performance evolution of the crosslinked polyethylene (XLPE)–ethylene propylene diene monomer (EPDM) interface under repetitive impulse discharges. An interfacial discharge platform under impulse voltage was constructed, and the corresponding discharge signals were recorded. The surface morphologies and chemical modifications of the post-discharge specimens were characterized. Results indicate that the discharge inception voltage (DIV) first increases and then decreases with the number of impulses. The rising stage is associated with the formation of a discharge-induced surface reformation zone (DSRZ), where localized asperities on the XLPE surface are oxidized and decomposed due to particle bombardment and thermal effects, leading to reduced surface roughness and improved interfacial contact. As the discharge progresses, carbonized byproducts begin to appear and gradually accumulate, counteracting the beneficial effects of the DSRZ and resulting in the turning point of the DIV. Eventually, the effect of carbonized byproducts dominates, causing a continuous decline in the DIV and a progressive deterioration of the interfacial condition. In addition to revealing the degradation mechanism, the stage-wise evolution of electrical signals provides valuable references for the monitoring and diagnosis of insulation conditions in HV systems.
重复脉冲放电下XLPE-EPDM界面绝缘性能演变
新兴的电力电子系统将高压(HV)设备暴露在频繁的脉冲应力下,这对电缆附件等组件的固体-固体绝缘接口的可靠性提出了挑战。虽然界面的击穿特性已经得到了广泛的研究,但在这种条件下的长期降解仍然没有得到充分的了解。本文研究了交联聚乙烯(XLPE) -乙丙二烯单体(EPDM)界面在重复脉冲放电作用下的性能演变。搭建了脉冲电压下的界面放电平台,并记录了相应的放电信号。对放电后试样的表面形貌和化学修饰进行了表征。结果表明,放电起始电压(DIV)随脉冲个数先升高后降低。上升阶段与放电诱导表面重组区(DSRZ)的形成有关,在该区域,XLPE表面的局部凸起由于粒子轰击和热效应而被氧化和分解,导致表面粗糙度降低,界面接触改善。随着排放的进行,碳化副产物开始出现并逐渐积累,抵消了DSRZ的有利作用,导致DIV出现拐点。最终,碳化副产物的作用占主导地位,导致DIV持续下降,界面状况逐渐恶化。电信号的阶段演化除了揭示了劣化机理外,还为高压系统绝缘状态的监测和诊断提供了有价值的参考。
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来源期刊
IEEE Transactions on Dielectrics and Electrical Insulation
IEEE Transactions on Dielectrics and Electrical Insulation 工程技术-工程:电子与电气
CiteScore
6.00
自引率
22.60%
发文量
309
审稿时长
5.2 months
期刊介绍: Topics that are concerned with dielectric phenomena and measurements, with development and characterization of gaseous, vacuum, liquid and solid electrical insulating materials and systems; and with utilization of these materials in circuits and systems under condition of use.
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