Commissioning of a versatile grazing-incidence platform at a very small angle neutron scattering instrument for investigating nano-to-microscopic colloidal assembly

IF 2.7 3区 材料科学 Q2 CHEMISTRY, MULTIDISCIPLINARY
Journal of Applied Crystallography Pub Date : 2026-10-05 Epub Date: 2026-09-25 DOI:10.1107/S1600576726008022
Qing Chen, Taisen Zuo, Changli Ma, Yongcheng He, Xiong Lin, Zhenqiang He, Zehua Han, Peter Müller-Buschbaum, He Cheng
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引用次数: 0

Abstract

Grazing-incidence small-angle neutron scattering (GISANS) is a powerful technique for probing buried interfacial structures, yet its in-plane length-scale sensitivity is typically limited to a few hundred nanometres. Here, we report the successful commissioning of a standard GISANS and a novel grazing-incidence very small angle neutron scattering (GI-VSANS) setup at the China Spallation Neutron Source (CSNS), which extends the accessible in-plane length scale of conventional GISANS to several micrometres. This breakthrough establishes GI-VSANS as an essential complementary tool to standard GISANS for investigating hierarchical and microscopic structures at thin film interfaces. To overcome the challenges of low neutron flux and high sensitivity to the alignment of sample planes, which are inherent to VSANS instruments, we developed and implemented an apparatus that integrates a four-blade slit system and a multi-slit collimation array for precise beam focusing over the sample plane. We demonstrate the capability of this platform by resolving the in-plane size, distribution and hierarchical assembly patterns of colloids with diameters ranging from the nano- to submicrometre scale, and prepared from different coating methods. Based on this platform, colloidal assembly patterns are resolved at the nanoscale (by the GISANS configuration) and the microscale (by the GI-VSANS configuration) through quantitative analysis. The successful commissioning and validation of this user-friendly, modular GI-VSANS setup not only overcome significant instrumental challenges but also provide users at spallation neutron sources with a unique tool for probing previously inaccessible microscale in-plane interfacial structure.

用于研究纳米到微观胶体组合的小角度中子散射仪的多功能掠射平台调试
掠入射小角中子散射(GISANS)是探测埋藏界面结构的一种强大技术,但其面内长度尺度灵敏度通常限制在几百纳米。在这里,我们报道了在中国散裂中子源(CSNS)上成功调试了一个标准的GISANS和一个新的掠射极小角中子散射(GI-VSANS)装置,它将传统GISANS的可访问面内长度尺度扩展到几微米。这一突破使GI-VSANS成为标准GISANS的重要补充工具,用于研究薄膜界面的分层和微观结构。为了克服VSANS仪器固有的低中子通量和对样品平面对准的高灵敏度的挑战,我们开发并实现了一种集成了四叶片狭缝系统和多狭缝准直阵列的仪器,用于在样品平面上精确聚焦光束。我们通过解决不同涂层方法制备的直径从纳米到亚微米的胶体的平面内尺寸,分布和分层组装模式来证明该平台的能力。基于该平台,通过定量分析,在纳米尺度(GISANS配置)和微观尺度(GI-VSANS配置)上解析了胶体组装模式。这种用户友好的模块化GI-VSANS装置的成功调试和验证不仅克服了重大的仪器挑战,而且为散裂中子源的用户提供了一种独特的工具,用于探测以前无法访问的微尺度平面内界面结构。
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来源期刊
Journal of Applied Crystallography
Journal of Applied Crystallography CHEMISTRY, MULTIDISCIPLINARYCRYSTALLOGRAPH-CRYSTALLOGRAPHY
CiteScore
7.80
自引率
3.30%
发文量
178
期刊介绍: Many research topics in condensed matter research, materials science and the life sciences make use of crystallographic methods to study crystalline and non-crystalline matter with neutrons, X-rays and electrons. Articles published in the Journal of Applied Crystallography focus on these methods and their use in identifying structural and diffusion-controlled phase transformations, structure-property relationships, structural changes of defects, interfaces and surfaces, etc. Developments of instrumentation and crystallographic apparatus, theory and interpretation, numerical analysis and other related subjects are also covered. The journal is the primary place where crystallographic computer program information is published.
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